Modular Test Device Segmentation for LTE 5G Networks
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Solution Overview
Problem
Conventional test and measurement devices for telecommunication networks are bulky, costly, and inefficient, as they often require multiple tools and instruments for various tests and measurements, and when one component fails, the entire device must be replaced, leading to high costs and downtime.
Innovation Solution
A modular test device with interchangeable components, allowing specific modules such as the display or test modules to be replaced independently, providing a flexible, customizable, and cost-effective solution for performing multiple tests and measurements across various network types and topologies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional test and measurement devices are used, then comprehensive testing capability is achieved, but device size and cost increase
Solution Approach 1:
The test device is divided into separate functional modules including a controller module, device under test module, and display module that can be physically separated and independently replaced. This segmentation allows the system to maintain comprehensive testing capabilities while reducing the size of each individual component and enabling flexible configuration.
Solution Approach 2:
The modular architecture with standardized interfaces enables different module combinations to perform various testing functions. The same basic modules can be reconfigured for different device types and test scenarios, providing universal testing capability across multiple platforms without requiring dedicated large-scale equipment for each function.
2Adaptability or versatility
If conventional test and measurement devices are used, then comprehensive testing capability is achieved, but device cost increases
Solution Approach 1:
By segmenting the device into standardized modules, the system enables independent manufacturing and sourcing of individual components. This allows cost optimization through specialized production of each module type and facilitates replacement of only defective modules rather than entire expensive equipment.
Solution Approach 2:
The modular design with standardized interfaces enables easy replacement of failed modules while recovering and retaining functional modules for continued use. This extends the lifecycle of expensive components and reduces overall equipment costs by preventing complete system replacement.
3Reliability
If complete test device replacement is performed upon component failure, then system reliability is maintained, but downtime and cost increase
Solution Approach 1:
The physical separation of functional modules with standardized connection interfaces enables isolation of failed components without affecting other parts of the system. This allows rapid replacement of only the defective module while the rest of the system remains operational, maintaining reliability while minimizing downtime.
Solution Approach 2:
The failed module can be extracted and removed from the system independently, allowing the functional portions to continue operating. This extraction capability enables maintenance without complete system shutdown and facilitates quick replacement with minimal interruption to testing operations.
4Reliability
If complete test device replacement is performed upon component failure, then system reliability is maintained, but cost increases
Solution Approach 1:
Segmentation into replaceable modules allows replacement of only the failed component rather than the entire expensive system. This dramatically reduces replacement costs while maintaining system reliability through modular substitution with standardized interfaces.
Solution Approach 2:
Functional modules can be recovered and retained after a failure event, replacing only the defective portion. This recovery approach preserves the value of working components and reduces overall replacement costs compared to discarding and replacing the entire system.
Data Source
AI summary
A modular test instrument for performing tests and measurements in a network is disclosed. The modular test instrument may include a modular processing unit comprising a processor and memory, the modular processing unit connectable to at least one modular test unit or modular test subunit. The modular test instrument may also include a modular display unit connectable to the modular processing unit or the modular test unit. Display modularity may enable quick and cost-efficient display replacement when damage, malfunction, or failure is incurred. Furthermore, the modular test instrument may include an additional modular test subunit connectable to at least one of the modular processing unit or the modular test unit. When the modular processing unit is fitted with the modular display unit, the modular least, or modular test subunit, for example, the modular test instrument may form an integrated test instrument for performing any number of tests and measurements associated with installation, troubleshooting, or maintenance of a long-term evolution (LTE) or 5G network.