Modular Test Module With Universal Resource Section
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Solution Overview
Problem
Conventional test devices require significant development costs and time due to the need for individualized test modules for each specific test function, leading to high development and production costs and lengthy development times.
Innovation Solution
A test apparatus with modular test channels, each comprising a universal section providing unspecific resources and a specific section tailored to a particular test function, allowing for the reuse of the universal section across different modules, reducing development efforts and costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If individualized test modules are developed for each specific test function, then test functionality and reliability are improved, but development costs and device complexity increase significantly
Solution Approach 1:
The patent implements a universal resource section in each test module that provides common resources (memory, processing power, control interfaces) that can be used across different test functions. This allows a single test module to support multiple test types by configuring different specific sections with the same universal infrastructure, thereby reducing overall system complexity and development costs while maintaining comprehensive test functionality.
Solution Approach 2:
The test module is divided into two distinct sections: a universal resource section that handles common functions and a specific section that handles test-function-specific operations. This segmentation allows the universal portion to be reused across multiple test modules and test types, reducing redundant development while the specific sections can be independently configured for different test requirements.
2Adaptability or versatility
If individualized test modules are developed for each specific test function, then test specificity is improved, but development time increases
Solution Approach 1:
By providing a universal resource section that can be configured for different test functions, the system achieves test specificity without requiring complete individualization of each module. The universal section serves as a reusable template that reduces development time, while the specific section allows customization for particular test requirements.
Solution Approach 2:
The universal resource section is pre-configured with common test resources and interfaces that can be immediately utilized. This preliminary preparation eliminates the need to build these resources from scratch for each new test function, significantly reducing development time while maintaining the ability to adapt to specific test requirements through configuration.
3Reliability
If complete individualization of test modules is performed, then test function performance is improved, but production costs increase
Solution Approach 1:
The universal resource section provides a standardized, reusable foundation that can be manufactured once and deployed across multiple test modules. This universality reduces production costs by eliminating redundant manufacturing of common components, while the specific section maintains the performance requirements for individual test functions through targeted customization.
Solution Approach 2:
Common resources and functions are merged into the universal section, allowing multiple test modules to share the same hardware and software infrastructure. This consolidation reduces production costs by decreasing the total number of components that need to be manufactured and tested, while the specific sections preserve the necessary functional differentiation for various test types.
Data Source
AI summary
A test module for a test apparatus for testing a device under test, the test module being adapted for performing a specific test function and having a universal section adapted to provide test resources being unspecific with regard to the test function of the test module, the universal section having a control interface adapted to be connected to a central control device of the test apparatus, and having a specific section to be coupled to the universal section and adapted to provide test resources being specific with regard to the test function of the test module, the specific section having a device under test interface adapted to be connected to the device under test.


