Modular Test Platform for Scalable System Level Testing
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Solution Overview
Problem
Conventional test systems are expensive, labor-intensive, and not adaptable to varying device form factors or changing user needs, limiting their suitability for volume production and flexibility in testing different types of electronic devices.
Innovation Solution
A modular test system with interchangeable primitives, device interface boards, and automation components that allow for scalable, user-configurable system level testing, thermal control, and debugging, enabling testing of various electronic devices with different form factors and requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional fixed test systems are used, then testing can be performed, but the systems are expensive to build and operate
Solution Approach 1:
The test system is divided into discrete, interchangeable primitive modules (e.g., power primitives, test primitives, debug primitives) that can be independently selected and configured. This segmentation allows the system to be built with only the necessary components for each specific testing application, reducing overall system cost while maintaining full testing capability.
Solution Approach 2:
The primitive modules are designed with universal interfaces and standardized connection mechanisms that allow the same primitive to be used across multiple different testing configurations and device types. This multi-functionality reduces the need for multiple specialized test systems, thereby lowering build and operational costs.
2Reliability
If conventional fixed test systems are used, then testing can be performed, but physical manipulation of devices under test is labor intensive
Solution Approach 1:
The test system incorporates automated device handling mechanisms where devices under test are automatically positioned, connected to appropriate primitives, and configured based on device identification. This self-service capability eliminates manual manipulation steps, reducing labor intensity while ensuring reliable testing.
Solution Approach 2:
Manual mechanical manipulation of devices is replaced with automated positioning systems and robotic handling mechanisms. These systems use sensors, actuators, and control algorithms to automatically manage device placement and connection, substituting mechanical labor with automated systems.
3Reliability
If conventional fixed test systems are used, then testing can be performed, but the systems are not readily adaptable to changing user needs and different device form factors
Solution Approach 1:
The test system configuration is made dynamic and reconfigurable through software control. Users can dynamically add, remove, or reconfigure primitive modules based on the specific testing requirements and device form factors being tested, allowing the system to adapt to changing needs without physical reconfiguration or specialized hardware for each device type.
Solution Approach 2:
The system allows changes in testing parameters, device interfaces, and primitive configurations through software programming rather than hardware modification. This parameter-based adaptability enables the same physical system to test different device types by simply changing the configured parameters and selected primitives.
4Adaptability or versatility
If modular primitives are added or removed to provide scalability, then adaptability improves, but device complexity increases
Solution Approach 1:
A host controller serves as an intermediary between the user and the complex primitive modules. The host controller provides a simplified interface for selecting, configuring, and managing multiple primitives, abstracting away the underlying complexity while enabling scalable system configuration through a user-friendly control mechanism.
Data Source
AI summary
A scalable test platform can include one or more of a plurality of different device interface boards and a plurality of primitives. The different device interface boards can be configured to provide a uniform interface to couple different types of DUTs and or DUTs with different form factors to the plurality of primitives. The plurality of primitives can be configured to distribute power to the DUTs, and to perform system level testing of the respective DUTs. The plurality of primitives can be configurable by a user to perform any number of system level tests on a number of different types of DUTs and or DUTs with different form factors.