Modular Test Terminal Probe Assembly for Stable Pressing Travel
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing circuit test machines face issues with inconsistent pressing travel of test heads, potential damage to products, environmental waste due to replacing entire probe modules, and instability of radio-frequency cable connectors, which are difficult to manage effectively.
Innovation Solution
A modular test terminal design with detachable probe assemblies, including a connecting assembly and probe modules, allows for easy installation and removal of individual probe modules, and incorporates a buffering module and connecting sleeve to stabilize the connection, preventing damage and ensuring proper pressing travel.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple probe modules are encapsulated as a cluster and connected to the base, then the structural integrity and stability are improved, but the waste and replacement cost increase when one probe module fails
Solution Approach 1:
The patent divides the probe assembly into separable modules: a base, multiple probe modules that can be independently removed, and a connecting assembly. Each probe module can be detached and replaced individually without affecting other probe modules, enabling selective replacement of only the faulty component rather than the entire cluster.
2Reliability
If a screw is laterally mounted through the test terminal to fix the radio-frequency cable connector, then the connector stability is improved, but the connector may be damaged if the screw is mounted too deep or fall off if mounted too shallow
Solution Approach 1:
The patent introduces a connecting assembly as an intermediary component between the test terminal and the radio-frequency cable connector. This connecting assembly includes a limiting structure that mediates the fixing process, ensuring the screw is mounted at the correct depth to secure the connector without causing damage or detachment.
3Device complexity
If the pressing travel of the test head is not easily checked by staff, then the structural simplicity is maintained, but the system errors and product damage cannot be remedied in time
Solution Approach 1:
The patent incorporates a visual indication mechanism using color changes or visual markers on the test head or connecting assembly. This allows staff to easily check the pressing travel depth through visual cues without adding complex measurement devices, enabling timely detection and correction of pressing depth issues.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The design reduces waste and costs by enabling replacement of only faulty probe modules, stabilizes connections to prevent damage, and allows visual verification of pressing depth, thereby enhancing the reliability and efficiency of circuit testing.
Implementation Method 1
The buffering module is mounted on the main sleeve and is capable of compressing and stretching along the length direction of the main sleeve
Data Source
AI summary
A test terminal has a connecting assembly and at least one probe assembly. The connecting assembly has a first connecting unit and a second connecting unit. The first connecting unit has an installation hole and the second connecting unit has a limit space. The probe assembly includes a main sleeve, a connecting sleeve, a probe module, and a buffering module. The main sleeve is mounted through the installation hole and the limit space. The main sleeve has a channel and an abutting part mounted on an outer annular surface. The connecting sleeve is sleeved on the main sleeve and mounted through the installation hole. The probe module is mounted in the channel. The buffering module is mounted on the main sleeve and abuts the second connecting unit. The connecting sleeve and the buffering module together clamp the second connecting unit, facilitating ease in installing and removing the probe assembly.


