Modulated Illumination Source for Optical Metrology
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Solution Overview
Problem
Optical metrology systems face challenges with coherence artifacts such as interference fringes and speckle due to the long coherence length of laser-based illumination sources, leading to noise and instability, and require efficient time-sequencing of multi-wavelength illumination sources for accurate metrology.
Innovation Solution
The implementation of a modulatable illumination source with a modulation control system that modulates the drive current at a selected frequency to generate illumination with specific coherence features, reducing coherence artifacts and noise, and uses multiple illumination sources of different wavelengths with interleaved pulse trains for time-sequencing control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stability of the object's composition
If laser-based illumination sources are used to provide coherent light, then the light source stability and intensity are improved, but coherence artifacts such as interference fringes and speckle are generated
Solution Approach 1:
The patent applies periodic action by modulating the laser illumination source at a specific frequency to introduce temporal variations in the light output. This periodic modulation breaks the coherence of the laser light, thereby suppressing coherence artifacts such as interference fringes and speckle while maintaining the stability and intensity benefits of laser-based illumination.
2Adaptability or versatility
If optical-mechanical devices such as shutters and Pockels cells are used for time-sequencing multiple illumination sources, then time-sequencing control is achieved, but system stability and repeatability are reduced
Solution Approach 1:
The patent replaces optical-mechanical time-sequencing devices with electronic modulation control. By using electronic modulation to time-sequence multiple illumination sources, the system achieves reliable and repeatable control without the instability and noise introduced by mechanical components such as shutters and Pockels cells.
3Adaptability or versatility
If multiple illumination sources of different wavelengths are used for comprehensive metrology, then measurement capability is improved, but system complexity increases
Solution Approach 1:
The patent merges multiple illumination sources of different wavelengths into a single integrated system with a unified modulation control mechanism. This allows comprehensive metrology capabilities using multiple wavelengths while avoiding the complexity of separate control systems for each source, as all sources are modulated and time-sequenced through a common electronic control architecture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach suppresses coherence artifacts and noise, enhancing the precision and accuracy of optical metrology measurements while simplifying the system by eliminating the need for optical-mechanical components, thereby improving metrology throughput.
Implementation Method 1
a modulation control system communicatively coupled to the modulatable illumination source, wherein the modulation control system is configured to modulate a drive current of the modulatable illumination source at a selected modulation frequency suitable for generating illumination having a selected coherence feature
Implementation Method 2
a detector configured to detect at least a portion of illumination emanating from a surface of the sample
Implementation Method 3
In optical metrology settings where coherent light sources are implemented, the production of coherent artifacts, such as interference fringes resulting from duplicate images
Data Source
AI summary
The system includes a modulatable illumination source configured to illuminate a surface of a sample disposed on a sample stage, a detector configured to detect illumination emanating from a surface of the sample, illumination optics configured to direct illumination from the modulatable illumination source to the surface of the sample, collection optics configured to direct illumination from the surface of the sample to the detector, and a modulation control system communicatively coupled to the modulatable illumination source, wherein the modulation control system is configured to modulate a drive current of the modulatable illumination source at a selected modulation frequency suitable for generating illumination having a selected coherence feature length. In addition, the present invention includes the time-sequential interleaving of outputs of multiple light sources to generate periodic pulse trains for use in multi-wavelength time-sequential optical metrology.


