Modulated Light Pattern for Coverslip Positioning
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Automated slide scanning systems face challenges in accurately locating the position of a coverslip relative to the object plane of an optical microscope, especially in darkfield imaging modes where imaging artifacts from dust and debris complicate the process.
Innovation Solution
The system projects a two-dimensional light pattern onto the coverslip surface, analyzes the reflected pattern to determine the coverslip's position relative to the object plane, and adjusts the substrate position accordingly, reusing the optical pathways for both positioning and imaging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a separate range-finding imaging system is used to determine coverslip position, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent combines the range-finding function and imaging function into a single optical system. The same objective lens and detector are used both to determine coverslip position (via reflected light pattern analysis) and to acquire sample images, eliminating the need for separate range-finding hardware while maintaining measurement precision
Solution Approach 2:
The imaging system is designed to perform multiple functions: it can project light patterns onto the coverslip surface to determine its position, and subsequently acquire images of the sample. This multi-functionality reduces device complexity by consolidating what would traditionally require separate systems
2Measurement precision
If iterative position determination is performed during imaging, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The system performs coverslip position determination before sample imaging begins. By using the reflected light pattern analysis method to establish accurate coverslip positioning in advance, the system eliminates the need for iterative adjustments during the actual imaging process, thereby maintaining precision while improving imaging speed and productivity
3Measurement precision
If dust and debris are present on coverslip surface, then measurement precision deteriorates, but this should not affect sample imaging quality
Solution Approach 1:
The patent extracts the coverslip position measurement function from the sample imaging process. By analyzing the reflected light pattern from the coverslip surface separately and using this information to guide subsequent imaging, the system can determine position accurately without being affected by dust and debris that would interfere with both processes if combined
Solution Approach 2:
The reflected light pattern serves as an intermediary that carries information about coverslip position without being contaminated by sample-related interference. The system analyzes this intermediate pattern to determine positioning, then uses that information to guide the actual sample imaging, effectively separating the measurement process from the imaging process
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for rapid and accurate determination of the coverslip position, reducing imaging and processing times, and enabling high-quality image acquisition without iterative position determination during imaging.
Implementation Method 1
transmitting the modulated light pattern through an objective lens to a surface of a substrate, where the objective lens defines an object plane
Implementation Method 2
obtaining a plurality of images of the modulated light pattern reflected from a surface of a substrate
Data Source
AI summary
Methods include generating a modulated light pattern using a light modulator (108), transmitting the modulated light pattern through an objective lens (104) to a surface of a substrate (150), where the objective lens (104) defines an object plane, obtaining a plurality of images of the modulated light pattern reflected from the surface of a substrate (150), where each modulated light pattern is obtained at a different relative distance between the objective lens (104) and the substrate surface, analyzing the plurality of images to determine a reference location of the substrate surface relative to the objective lens (104) that corresponds to positioning of an image of the modulated light pattern formed by the objective lens (104) at the object plane, and adjusting a position of the substrate (150) relative to the objective lens (104) based on the reference location.