Digital Modulated Signal Test Apparatus for Multi-I/O Devices
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current test apparatuses lack the capability to efficiently test devices with multiple I/O ports using digital multi-level modulation, leading to difficulties in mass production due to limitations in hardware configuration and the need for real-time hardware-level testing.
Innovation Solution
A test apparatus is designed with a pattern generator, encoding circuit, data rate setting unit, and multi-level driver to generate and transmit digitally modulated signals, enabling direct generation of modulated signals in desired formats without increasing hardware scale, and includes features like adjustable sampling rate, jitter application, and error introduction for calibration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional test apparatuses with digital pins are used, then binary signals can be tested, but digital multi-level modulation signals cannot be tested
Solution Approach 1:
The test apparatus is designed with a universal signal generation capability that can handle both binary signals and digital multi-level modulation signals through a single apparatus. The pattern generator and encoding circuit can generate different signal types by changing the modulation mode, eliminating the need for separate test apparatuses for different signal types.
Solution Approach 2:
An encoding circuit is introduced as an intermediary component between the pattern generator and the device under test. This encoding circuit converts binary test patterns into digital multi-level modulation signals, enabling the test apparatus to handle modulation signals without requiring direct support for multiple signal types in the basic architecture.
2Productivity
If all I/O ports are configured with digital multi-level modulation, then transmission capacity increases, but testing becomes more complex
Solution Approach 1:
The test apparatus divides the testing function into multiple independent channels, each capable of testing individual I/O ports. This segmentation allows the apparatus to handle a large number of ports by parallel testing, reducing the complexity of managing and testing all ports simultaneously through modular architecture.
Solution Approach 2:
The test apparatus transitions from testing individual ports sequentially to testing multiple ports simultaneously through parallel channels. This dimensional change from sequential to parallel testing reduces the overall testing complexity and time, allowing efficient verification of devices with hundreds of I/O ports.
3Adaptability or versatility
If conventional RF test modules are used, then wireless communication devices can be tested, but devices with many I/O ports cannot be efficiently tested
Solution Approach 1:
The test apparatus is divided into multiple independent testing channels, each capable of simultaneously testing different I/O ports. This segmentation enables parallel testing of multiple ports, dramatically improving testing efficiency for devices with hundreds of I/O ports compared to sequential testing methods.
Solution Approach 2:
The apparatus can dynamically change testing parameters such as modulation mode, data rate, and signal level to match different device requirements. This parameter flexibility allows the same apparatus to efficiently test various device types without requiring hardware changes, improving both adaptability and productivity.
4Ease of operation
If A/D conversion and software processing are used for signal testing, then signal processing can be performed, but testing time increases
Solution Approach 1:
The apparatus replaces software-based signal processing with hardware-level parallel testing capabilities. By using multiple independent testing channels that operate simultaneously at the hardware level, the system eliminates the time-consuming sequential processing inherent in software-based approaches while maintaining comprehensive signal processing functionality.
Data Source
AI summary
A pattern generator generates test data to be transmitted. An encoding circuit generates amplitude data which represent a modulated signal waveform that corresponds to the test data. The amplitude data are generated in a parallel manner in the form of multiple amplitude data in increments of multiple sampling points set within a predetermined period for cycles of the predetermined period. A data rate setting unit receives the multiple amplitude data in increments of sampling points, latches the amplitude data at corresponding sampling timings, and sequentially outputs the amplitude data thus latched. A multi-level driver receives sequentially input amplitude data, and generates a test signal having a level that corresponds to the value of the amplitude data thus received.