Module Relationship Testing for Large-System Integration Coverage

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Solution Overview

Problem

Conventional integration testing methods, such as single system integration testing and incremental integration testing, fail to accurately and efficiently test large systems due to neglecting data flow and operation among specific modules, and do not consider the high-level system layer requirements.

Innovation Solution

A system testing method that acquires module relationship information to test at least two modules associated with each other for the same function implemented by the system, using a module relationship matrix and network diagram to reflect logical relationships among modules.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If single system integration testing method is used to test all modules as a large module, then testing process is simple, but test coverage decreases and test omissions increase as system size increases

Engineering Contradiction:
Improvetesting process simplicityVSAvoidtest coverage
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent segments the system into multiple modules and creates segment testing information for each module, then generates segment relationship information to test inter-module interactions. This segmentation approach maintains testing simplicity while improving test coverage by systematically examining both individual modules and their relationships.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If incremental integration testing method is used to integrate and test modules according to hierarchy, then module-level testing is improved, but system-level function requirements are not met

Engineering Contradiction:
Improvemodule-level testing accuracyVSAvoidsystem-level function compliance
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent adds a new dimension to testing by generating segment relationship information that captures inter-module interactions, going beyond the hierarchical module-level testing. This additional dimension ensures both module correctness and system-level function compliance by explicitly testing data flow and interactions between segments.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Loss of time

If conventional integration testing methods are used, then testing effort is reduced, but testing accuracy and efficiency decrease for large systems

Engineering Contradiction:
Improvetesting effortVSAvoidtesting efficiency
Core Design Contradiction:
Loss of timeVSProductivity

Solution Approach 1:

The patent performs preliminary actions by automatically generating segment testing information and segment relationship information before execution. This preliminary preparation enables more efficient testing by pre-organizing test cases and identifying critical inter-module relationships, reducing overall testing effort while improving efficiency.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12505022B2System testing method, electronic device, and computer program product
Publication Date: 2025.12.23 DELL PROD LP
  • US12505022B2 patent drawing
  • US12505022B2 patent drawing
  • US12505022B2 patent drawing

AI summary

System testing is described. An example system testing method includes: acquiring module relationship information for a system under test, the system under test including a plurality of modules, the module relationship information indicating a logical relationship between each two of the plurality of modules; and testing at least two modules in the system under test based on the module relationship information, the at least two modules being associated with each other for the same function implemented by the system under test. By use of the technical solution of the present disclosure, both system and module perspectives can be applied to system integration testing, so as to achieve a more comprehensive system testing coverage and find problems in the system under test as soon as possible, which can help to improve the system testing coverage and system testing efficiency.