MOEMS Mirror Array Beam Profiling Across Multiple Axial Positions
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Solution Overview
Problem
Existing laser beam characterization systems are costly, complex, and limited in wavelength range, particularly in multiphoton systems, requiring multiple components and separate beam characterization units for accurate beam profiling and position tracking.
Innovation Solution
A light beam characterization system using a micro-opto-electromechanical system (MOEMS) with an array of mirrors and a controller to perform beam profile measurements on multiple input light beams generated from a single source, allowing characterization at different axial positions using a single unit, combined with cost-effective detectors like single pixel diodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a position sensitive detector (PSD) is used for beam characterization, then beam position measurement is enabled, but the system becomes costly and limited to a narrow wavelength range (680-1100 nm)
Solution Approach 1:
The patent replaces the PSD (a specialized detector requiring complex positioning mechanisms) with a simple camera system. The camera captures beam profiles directly through optical paths, eliminating the need for mechanical positioning mechanisms and quadrant detector assemblies. This substitution enables wide wavelength range detection while maintaining measurement precision.
Solution Approach 2:
The camera serves multiple functions: it detects beam profiles, measures beam positions, and characterizes beam characteristics across a wide wavelength range. By making the detector universal rather than specialized, the system achieves both precise measurement and broad adaptability to different wavelengths.
2Measurement precision
If complete beam characterization is performed using conventional methods, then accurate beam profiling is achieved, but the system requires multiple beam characterization units at different locations, increasing cost and complexity
Solution Approach 1:
The patent introduces a dimensional approach by using multiple optical paths that capture beam profiles at different axial positions simultaneously. Instead of placing multiple characterization units at different locations along the beam path, the system uses optical splitting and imaging to capture multi-position data in a single detection plane, reducing system complexity while maintaining measurement accuracy.
Solution Approach 2:
The patent introduces an optical unit as an intermediary between the light beam and the camera. This optical unit includes optical elements that redirect and image the beam profile onto the camera sensor, enabling single-unit characterization. The optical intermediary processes the beam information to provide complete characterization data without requiring multiple separate measurement devices.
3Quantity of substance
If a camera is used for beam detection, then spatial distribution of light can be measured, but complete beam characterization is not possible since detection is limited to a single plane
Solution Approach 1:
The patent segments the beam characterization process by capturing multiple beam profiles at different axial positions through separate optical paths. Each optical path provides data from a specific region of the beam, and the camera integrates these segmented measurements to reconstruct the complete three-dimensional beam characteristics, achieving full beam characterization.
Solution Approach 2:
The patent transitions from single-plane detection to multi-plane characterization by using optical elements to image different axial positions of the beam onto the camera sensor. This dimensional approach allows the camera to capture spatial distribution data from multiple depths, enabling complete beam characterization including waist position, size, and orientation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise and flexible beam characterization over a wide wavelength range, reducing costs and complexity by using a single unit for multiphoton microscopy applications.
Implementation Method 1
Each mirror is switchable between a first switching state, in which the mirror reflects the light onto the detection device, and at least a second switching state, in which the mirror reflects the light away from the detector device
Implementation Method 2
an optical unit configured to direct the light in form of at least two different input light beams onto the micro-opto-electromechanical system
Implementation Method 3
a detector device comprising at least one detector unit configured to detect the light
Data Source
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AI summary
A light beam characterization system (100) for characterizing a light beam emitted by a light source (102) is disclosed. The light beam characterization system (100) comprises a detector device (108) comprising at least one detector unit (110, 112) configured to detect the light (L), and a micro-opto-electromechanical system (104) comprising an array of mirrors (106). Each mirror (106) is switchable between a first switching state, in which the mirror (106) reflects the light onto the detector device (108), and at least a second switching state, in which the mirror (106) reflects the light (L) away from the detector device (108). A controller (114) is configured to cause a beam profile measurement to be performed on the light (L) detected by the at least one detector unit (110, 112) while selectively switching the mirrors (106) between the first and second switching states. The light beam characterization system (100) further comprises an optical unit (116) configured to direct the light (L) in form of at least two different input light beams (L1, L2) onto the micro-opto-electromechanical system (104). The controller (114) is configured to cause the beam profile measurement to be performed on each of the at least two input light beams (L1, L2).