MOG Circuit Scan Signal Turn-Off Control
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Solution Overview
Problem
Conventional MOG circuits face limitations in achieving the all-gate-off function due to insufficient loading capability, which prevents the scan signal from reaching the required low voltage level for the turn-off state, restricting the operation of thin film transistors (TFTs) in MUX circuits.
Innovation Solution
The implementation of a cascaded MOG circuit with multiple sub-circuits, including a GOA circuit and a MUX circuit, where the first node signal controls the MUX circuit to stop inputting the MUX signal and the second node signal pulls down the scan signal to a low voltage level, allowing the scan signals to reach the necessary turn-off state even with lower loading capability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the MUX circuit uses standard TFT size, then the circuit area is limited, but the loading capability is insufficient to pull down the scan signal to the required low voltage level for turn-off state
Solution Approach 1:
The MUX circuit is divided into multiple parallel MUX units (first MUX unit, second MUX unit, etc.), each contributing to the overall loading capability. This segmentation allows the circuit to achieve the required pull-down strength without increasing the area of individual TFTs, as the combined effect of multiple units provides sufficient loading capability to pull the scan signal to the low voltage level needed for turn-off state.
2Reliability
If the MUX circuit increases loading capability to achieve proper turn-off voltage level, then the scan signal can reach required level, but the TFT size and circuit complexity increase
Solution Approach 1:
Multiple MUX units are merged in parallel configuration, sharing common control signals (first node signal, second node signal) and output node. This merging approach increases the overall loading capability to achieve proper voltage level control while maintaining relatively simple circuit structure, as the parallel units share control logic and output pathways.
3Reliability
If the TFT size in MUX circuit is increased to improve loading capability, then more charges can be handled, but the circuit area and manufacturing constraints are violated
Solution Approach 1:
The charge handling capability is segmented across multiple parallel TFTs in different MUX units rather than relying on a single large TFT. Each TFT maintains a standard, manageable size suitable for manufacturing, while the collective charge handling capability of all parallel TFTs provides the necessary loading capability to achieve proper scan signal voltage levels for turn-off state.
Data Source
AI summary
A MOG circuit and a display panel are provided. The MOG circuit controls the current-stage MOG circuit through the first node signal to block the input of the MUX signal. At the same time, the MOG circuit controls the current-stage MUX circuit through the second node signal such that the voltage level of the scan signal is pulled down to the voltage level of the first low voltage level signal. In this way, all the scan signals could satisfy the turn-off stage while the MUX circuit has a lower loading capability.