Molded Interconnection Substrate for Ultra-Thin SIP Packages
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Solution Overview
Problem
Current system in package (SIP) technologies face challenges in integrating active and passive components efficiently, particularly in achieving lower costs, smaller sizes, and better performance for wearable, mobile, and IoT devices, with bottlenecks in the Outsourced Assembly and Test (OSAT) process such as lengthy cycle times and high equipment costs due to the through mold via (TMV) process.
Innovation Solution
A molded interconnection substrate system that integrates active and passive components with redistribution layers and pre-prepared through mold via openings for solder balls, reducing the need for expensive laser ablation and bottom molding processes, and utilizing an epoxy molding compound for improved heat dissipation and electrical performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional through mold via (TMV) process with laser ablation is used, then electrical connections between top and bottom sides are achieved, but manufacturing cost and cycle time increase significantly
Solution Approach 1:
The patent applies preliminary action by pre-forming through-mold via openings and placing solder balls before the final molding process. The solder balls are positioned in the through-mold via openings on the bottom side of the molding compound before encapsulation, eliminating the need for post-molding laser ablation and solder ball placement, thus reducing cycle time while maintaining connection reliability
Solution Approach 2:
The patent replaces the traditional laser ablation process with a mechanical punching or drilling method to create through-mold via openings. This mechanical approach is faster and more cost-effective than laser ablation while achieving the same electrical connection function through the molding compound
2Adaptability or versatility
If traditional ETS substrate with bottom molding process is used, then component integration is achieved, but device thickness increases
Solution Approach 1:
The patent transitions from a traditional planar ETS substrate architecture to a three-dimensional molded interconnection substrate architecture. By forming through-mold via openings that extend vertically through the molding compound and placing solder balls within these openings, the patent achieves component integration in the Z-dimension (thickness direction) rather than only in the planar X-Y dimensions, enabling ultra-thin package profiles while maintaining integration capability
Solution Approach 2:
The patent applies the nested doll principle by placing solder balls inside the through-mold via openings formed within the molding compound. The solder balls are nested within the cavities created by the through-mold via openings, allowing electrical connections to be formed within the package structure itself rather than requiring additional external connection layers, thus reducing overall package thickness
3Manufacturing precision
If expensive laser ablation equipment is used for TMV process, then through mold via openings are formed, but manufacturing cost increases
Solution Approach 1:
The patent replaces expensive, complex laser ablation equipment with simpler, more cost-effective mechanical punching or drilling tools. These mechanical tools provide sufficient precision for forming through-mold via openings without the high equipment costs and operational expenses associated with laser systems, making the manufacturing process more economically viable while maintaining adequate via opening precision
Solution Approach 2:
The patent substitutes the optical laser ablation system with a mechanical punching or drilling system. This mechanical approach uses physical force to create through-mold via openings rather than using laser energy to vaporize material, resulting in lower equipment costs, reduced operational complexity, and decreased manufacturing expenses while achieving comparable via opening precision through optimized mechanical tool design
Data Source
AI summary
A molded interconnection substrate system in package is achieved comprising a molding compound having redistribution layers therein, at least one first active or passive component mounted on one side of the molded interconnection substrate and embedded in a top molding compound, at least one second active or passive component mounted in a cavity on an opposite side of the molded interconnection substrate wherein electrical connections are made between the at least one first active or passive component and the at least one second active or passive component through the redistribution layers and solder balls mounted in openings in the molded interconnection substrate to the redistribution layers wherein the solder balls provide package output.


