Semiconductor Monitoring Circuit With DAC-ADC Process Sensing

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Solution Overview

Problem

Existing monitoring circuits face challenges in accurately measuring process characteristics of semiconductor devices due to limitations in digital logic analysis methods, which lack identifiable information and struggle with analog circuits, and analog analysis methods that require extensive probing and are difficult to embed within devices.

Innovation Solution

A monitoring circuit is designed to accurately monitor process characteristics by incorporating a sensor circuit with a selection mechanism, an input circuit with a digital-to-analog converter, and an output circuit with an analog-to-digital converter, allowing for digital data input to be converted into analog signals applied to devices under test, and subsequently converting output signals into digital data for analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If digital logic characteristics analysis method is used, then ease of integration and operation is improved, but measurement precision and information completeness deteriorates

Engineering Contradiction:
Improveease of integrationVSAvoidmeasurement precision
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent introduces an analog buffer circuit as an intermediary component between the digital logic analysis system and the device under test. This buffer circuit receives analog signals from the DUT, converts them to digital signals, and provides them to the analysis system. This intermediary enables the digital system to access analog characteristics that would otherwise be inaccessible, thereby improving measurement precision while maintaining the ease of operation of digital logic analysis.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent employs parameter changes by utilizing multiple operating conditions (different voltages, temperatures, and frequencies) for analyzing the device under test. The system varies these parameters and observes changes in both digital logic characteristics and analog characteristics, enabling comprehensive process monitoring. This approach allows the system to extract more information from the same hardware infrastructure, improving measurement precision without compromising ease of operation.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If analog characteristics analysis method is used, then measurement precision is improved, but device complexity and area requirement increases

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges the digital logic analysis functionality with analog characteristics analysis by integrating an analog buffer circuit into the existing digital analysis infrastructure. The buffer circuit is shared between digital logic operations and analog signal processing, allowing both types of analysis to occur within the same device without requiring separate independent systems. This merging reduces overall device complexity and area requirements while maintaining high measurement precision for analog characteristics.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The analog buffer circuit is designed with multi-functionality, serving both as part of the digital logic analysis system and as an analog signal processing unit. The same hardware infrastructure is used for both digital and analog measurements, eliminating the need for separate dedicated analog analysis equipment. This universal approach reduces device complexity while enabling precise analog characteristics measurement.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Loss of information

If analog buffer circuit is introduced, then information completeness is improved, but device complexity increases

Engineering Contradiction:
Improveinformation completenessVSAvoiddevice complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The patent segments the analysis system into distinct functional modules: a digital logic analysis unit, an analog buffer circuit, and a process monitoring unit. The analog buffer circuit is specifically segmented to handle only the analog signal buffering and conversion functions, keeping its design simple and focused. This segmentation allows the system to gather comprehensive information (improving information completeness) while maintaining manageable device complexity through modular architecture.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The analog buffer circuit acts as an intermediary that bridges the digital and analog domains without requiring complex integration. It performs the specific function of receiving analog signals, buffering them, converting to digital format, and passing to the analysis system. This intermediary role is clearly defined and isolated, preventing complexity from propagating throughout the entire system while still enabling complete information capture.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables accurate and efficient monitoring of process characteristics within semiconductor devices, improving analysis capabilities and reducing defects by providing detailed and representative data of actual device conditions.

Implementation Method 1

the input circuit includes a digital-to-analog converter configured to convert the input digital data into the first signal

Methodology Applied
Scientific EffectDigital-to-analog conversion:

Implementation Method 2

the output circuit includes an analog-to-digital converter configured to convert the second signal into output digital data

Methodology Applied
Scientific EffectAnalog-to-digital conversion:

Data Source

PatentUS20250067805A1Monitoring circuit, integrated circuit including the same, and operating method of monitoring circuit
Publication Date: 2025.02.27 SAMSUNG ELECTRONICS CO LTD
  • US20250067805A1 patent drawing
  • US20250067805A1 patent drawing
  • US20250067805A1 patent drawing

AI summary

A monitoring circuit includes a sensor circuit having a plurality of devices and a selection circuit, which selects a device to be monitored among the plurality of devices, an input circuit, which applies, based on input digital data, a first signal to the device to be monitored and an output circuit, which generates output digital data based on a second signal generated by the sensor circuit. The input circuit includes a digital-to-analog converter, and the output circuit includes an analog-to-digital converter.