Monitoring Slicer Circuit for Internal Analog Signal Debugging
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Solution Overview
Problem
High-speed electronic devices often lack the capability to monitor internal analog signals due to the large size and high power consumption of analog-to-digital converters (ADCs), making it difficult to debug and troubleshoot these devices effectively.
Innovation Solution
A system that includes a monitoring slicer, which compares internal analog signals to a reference voltage, providing a compact and power-efficient means to determine signal levels, and a logic analyzer that reconstructs the internal signal using a series of test signals and reference voltage levels, allowing for accurate debugging without the need for high-speed ADCs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an ADC is used to convert internal analog signals to digital form for monitoring, then measurement precision is improved, but area and power consumption increase significantly
Solution Approach 1:
The patent extracts only the essential function of signal level detection from the complete ADC system. Instead of implementing a full ADC, the invention uses a simplified monitoring slicer that only compares the analog signal to reference voltages and outputs digital indicators of signal levels, eliminating the need for complex conversion circuits while maintaining debugging capability
Solution Approach 2:
The patent replaces the expensive, complex ADC with a simple, low-cost monitoring slicer circuit that uses basic voltage comparison. This simplified 'disposable' monitoring approach consumes minimal area and power while providing sufficient information for debugging purposes
2Measurement precision
If an ADC is used to convert internal analog signals to digital form for monitoring, then measurement precision is improved, but power consumption increases significantly
Solution Approach 1:
The patent extracts only the essential function of signal level detection from the complete ADC system. Instead of implementing a full ADC, the invention uses a simplified monitoring slicer that only compares the analog signal to reference voltages and outputs digital indicators of signal levels, eliminating the need for complex conversion circuits while maintaining debugging capability
Solution Approach 2:
The patent replaces the expensive, complex ADC with a simple, low-cost monitoring slicer circuit that uses basic voltage comparison. This simplified 'disposable' monitoring approach consumes minimal area and power while providing sufficient information for debugging purposes
3Area of stationary object
If a monitoring slicer is used instead of an ADC, then area and power consumption are reduced, but the ability to fully reconstruct analog signals is compromised
Solution Approach 1:
The patent introduces multiple reference voltage levels as intermediaries between the analog signal and the digital output. By comparing the analog signal against a ladder of reference voltages, the monitoring slicer captures sufficient information about the signal's amplitude and timing without requiring a full ADC, thus preserving essential debugging information while using minimal circuitry
Solution Approach 2:
The patent replaces the mechanical/electronic complexity of an ADC with a simpler voltage comparison mechanism. The monitoring slicer uses basic voltage threshold detection instead of complex conversion algorithms, substituting a simple physical comparison process for a complex electronic system while retaining the ability to monitor signal behavior
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient debugging and troubleshooting of high-speed electronic devices by accurately reconstructing internal analog signals with reduced area and power consumption, compared to traditional ADCs, while maintaining high operational rates.
Implementation Method 1
a monitoring slicer adapted to repeatedly sample an internal analog signal to provide a sequence of digital outputs indicating a result of a comparison of the level of the internal analog signal to a reference voltage
Data Source
AI summary
A device, comprising a monitoring slicer adapted to repeatedly sample an internal analog signal to provide a sequence of digital outputs indicating a result of a comparison of the level of the internal analog signal to a reference voltage and an operative unit adapted to perform a task of the device and provide a result without using digital outputs from the monitoring slicer.


