Grating Monochromator Quantum Efficiency Test Controller for Multijunction Cells

The patent combines multiple bias light sources into a single integrated system that can activate multiple junctions simultaneously. Instead of sequentially activating each bias light source for different junctions, the invention merges them into a unified configuration where all bias lights are activated at once during a single monochromator scan, thereby maintaining measurement accuracy while dramatically reducing measurement time.

The patent implements continuous measurement by eliminating the sequential gaps between individual junction measurements. By activating all bias light sources simultaneously and performing a single continuous monochromator scan, the system maintains continuous useful action throughout the measurement process, avoiding the time losses associated with sequential activation and deactivation of individual bias lights.

The patent creates a multi-functional measurement system that can simultaneously measure multiple junctions across the entire spectrum in a single scan. The unified bias light activation approach enables the system to perform what previously required multiple specialized measurements, achieving both the speed of LED-based techniques and the wavelength resolution of grating monochromators by making the system universal in its measurement capability.

The patent replaces the mechanical sequential activation mechanism with a simultaneous electronic control system. Instead of mechanically switching between individual bias light sources in sequence, the invention uses electronic control to activate all bias light sources at once, substituting the mechanical sequential operation with an electronic simultaneous operation that maintains both speed and precision.

The patent segments the measurement task by simultaneously measuring all junctions in parallel during a single scan, rather than sequentially measuring each junction separately. This segmentation approach divides the overall measurement into concurrent sub-measurements for each junction, all captured simultaneously, thereby maintaining complete spectral data for each junction while eliminating the time-consuming sequential scan process.

The patent implements a single periodic monochromator scan that captures all junction characteristics simultaneously, replacing the multiple periodic scans previously required. By synchronizing the monochromator scan with simultaneous activation of all bias light sources, the system obtains complete quantum efficiency spectra for all junctions in one periodic action, dramatically improving measurement throughput.