Monocrystal Side-Length Probe Measurement After Grinding
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Solution Overview
Problem
Conventional manual measurement of monocrystal side length after grinding in solar monocrystal silicon wafer production is inaccurate and inefficient, leading to low work efficiency and high measurement errors.
Innovation Solution
A device with symmetrically arranged measuring devices on a detection table, featuring a first driver for horizontal movement of a column and mechanical arm, and a probe assembly with sensors to automatically measure side lengths, including a probe with a retractable design and sensors to detect contact and retraction distances.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual measurement with vernier caliper is used, then device complexity is low, but measurement precision and productivity are poor
Solution Approach 1:
The patent replaces manual mechanical measurement with an automated measurement system that uses a probe assembly, mechanical arm, and driver to automatically contact and measure the monocrystal sides, eliminating manual operation errors and improving measurement precision
Solution Approach 2:
The measurement system performs self-positioning and self-measurement through the automated coordination of the driver, mechanical arm, and probe assembly, which automatically locate and measure the monocrystal sides without requiring manual intervention, thereby improving both precision and efficiency
2Productivity
If manual measurement is used, then device complexity is low, but productivity is low
Solution Approach 1:
The patent replaces manual measurement operations with an automated mechanical system comprising a driver, mechanical arm, and probe assembly that can rapidly and repeatedly measure multiple monocrystals without fatigue or delay, significantly improving productivity
Solution Approach 2:
The measurement system is pre-configured with symmetric measuring devices positioned on both sides of the detection table, allowing simultaneous or sequential measurement of opposite sides without repositioning, thereby reducing measurement time and improving productivity
3Manufacturing precision
If automated measurement system is implemented, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent divides the measurement system into modular components including separate drivers, mechanical arms, and probe assemblies that can be independently manufactured, assembled, and maintained, making the complex system manageable and easier to implement
Solution Approach 2:
The patent employs symmetric arrangement of measuring devices on both sides of the detection table, which simplifies the overall system design by creating balanced, repeatable measurement paths and reducing the need for complex positioning mechanisms
Data Source
AI summary
A device for automatically measuring a side length of a monocrystal after grinding may include a detection table, a first driver, a mechanical arm and a probe assembly, the detection table is used for placing the monocrystal to be detected, the measuring devices are symmetrically arranged on both sides of the detection table, one end of the first driver is connected to a side of the detection table, an column is disposed above another end of the first driver, and the first driver is capable of driving the column to move horizontally, the mechanical arm is arranged at a side of the column close to the detection table, and the probe assembly is arranged at one end of the mechanical arm away from the column.