Monolithic Driver Inspection via Switching Lines
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Solution Overview
Problem
In liquid crystal display devices with a driver monolithic structure, the narrow line widths and insulating film coverage make it difficult to inspect output waveforms of the drive circuits, leading to challenges in identifying failure causes and reducing yield ratios.
Innovation Solution
An electronic device configuration with a first line connected to a connection terminal and a second line for extracting output waveforms, along with a switching section that alternates between connected and disconnected conditions for predetermined times, allows for the inspection of output waveforms even in monolithic structures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the drive circuit is integrated with the substrate in a monolithic structure, then circuit density is improved and device size is reduced, but inspection of output waveforms becomes difficult due to narrow line widths and insulating film coverage
Solution Approach 1:
The patent divides the inspection function into separate components: a first line for signal input, a second line for waveform extraction, and a switching section for connection control. This segmentation allows the inspection system to access the drive circuit without requiring direct access to the narrow integrated lines, thereby resolving the contradiction between high circuit density and inspection accessibility
Solution Approach 2:
The patent introduces an intermediary inspection system comprising connection terminals, first lines, second lines, and switching sections that mediates between the external inspection equipment and the integrated drive circuit. This intermediary structure enables waveform extraction from the monolithic drive circuit without compromising its integrated design, solving the inspection difficulty while maintaining high circuit density
2Measurement precision
If multiple inspection points are added to enable waveform extraction, then inspection capability is improved, but device complexity increases
Solution Approach 1:
The switching section is designed to multiplex multiple inspection functions through a single structured connection system. The first lines and second lines can be configured to access different nodes of the drive circuit, and the switching section routes signals appropriately. This multi-functional design enables comprehensive waveform extraction at multiple points without proportionally increasing structural complexity
Solution Approach 2:
The patent adds a temporal dimension to the inspection system by introducing time-division multiplexing through the switching section. Different inspection points can be accessed at different time intervals, allowing multiple measurement functions to share the same physical infrastructure. This dimensional approach enables enhanced inspection capability without linearly increasing device complexity
Data Source
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AI summary
An electronic device of the present invention includes a shift register SR provided integrally with a substrate, a first line 11 connected with a connection terminal 101 electrically connectable with an outside device provided independently of the shift registers SR, second lines 12a through 12c via which output waveforms of the shift register SR are extracted, and switching sections 13a through 13c by which the first line 11 and the second lines 12a through 12c are switched between an electrically connected condition and an electrically disconnected condition. With this, even in a case where the electronic device of the present invention is a liquid crystal display device having a driver monolithic structure, output waveforms of a drive circuit (electronic circuit) can be inspected.