Monolithic IC Chip Integrating GaN and SiC Transistors

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing semiconductor topologies face challenges in integrating multiple devices with different structures and material systems on a single chip, particularly for high-power and high-frequency applications like X-band panel radar, where space constraints and voltage tolerance issues limit the feasibility of monolithic IC chips.

Innovation Solution

A monolithic IC chip integrating gallium nitride (GaN) and silicon carbide (SiC) transistors, including a GaN radio or microwave frequency power amplifier, a SiC drain modulator, and a bipolar junction transistor (BJT), on a shared substrate, with a GaN layer and aluminum gallium nitride layer, enabling operation at higher voltages and fitting within smaller unit cells.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple transistors of different types and material systems are integrated on a single chip, then device functionality and performance are improved, but manufacturing complexity and difficulty increase

Engineering Contradiction:
Improvedevice functionalityVSAvoidmanufacturing complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The chip is divided into distinct regions with different substrate orientations (first orientation and second orientation). Each region is dedicated to specific transistor types, allowing independent optimization of manufacturing processes for each material system while maintaining monolithic integration on a single chip.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the substrate are assigned different crystallographic orientations to accommodate different transistor types. This local differentiation enables each region to have optimized properties for its specific function, with first-type transistors in the first orientation region and second-type transistors in the second orientation region.

Inventive Principle:
Principle #3Local quality

2Ease of manufacture

If standard CMOS circuitry with non-SiC MOSFETs is used, then manufacturing ease is improved, but voltage tolerance capability deteriorates

Engineering Contradiction:
Improvemanufacturing easeVSAvoidvoltage tolerance
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The chip integrates both SiC MOSFETs and non-SiC MOSFETs on the same substrate. SiC MOSFETs provide high voltage tolerance for power handling applications, while non-SiC MOSFETs offer easier manufacturing for standard logic functions. This composite approach combines the advantages of both material systems in a single monolithic device.

Inventive Principle:
Principle #40Composite materials

Data Source

PatentEP2878009B1X-band radar with integrated circuit chips
Publication Date: 2019.09.11 RAYTHEON CO
  • EP2878009B1 patent drawingFigure 1
  • EP2878009B1 patent drawingFigure 2
  • EP2878009B1 patent drawingFigure 3

AI summary

A monolithic integrated circuit (IC) chip containing a plurality of transistors, including: a substrate; a first transistor on the substrate; and a second transistor integrally formed on the substrate with the first transistor, the second transistor having a different structure than the first transistor, wherein the first transistor includes a first material system and the second transistor includes a second material system different from the first material system. The monolithic IC chip may further include a third transistor integrally formed on the substrate with the first and second transistors. The first transistor may include gallium nitride (GaN) and the second and third transistors may include silicon carbide (SiC).