MOS Driver Circuit Slew Rate Control With Impedance Code Correction

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Solution Overview

Problem

Existing driver circuits face challenges in achieving desired output slew rates due to manufacturing variability in the slew rate control part and gate driving parts, leading to inconsistent bias voltages and slew rates.

Innovation Solution

The proposed driver circuit includes a current source circuit that generates signals to control the driving ability of the gate control part, using plural transistors connected in parallel with a common resistor and a signal generation part that adjusts the driving ability based on input current, along with a correction code generation part to fine-tune impedance codes and suppress manufacturing variability effects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a current source circuit with plural transistors connected in parallel is used to control driving ability, then the output slew rate can be adjusted, but manufacturing variability causes inconsistent bias voltages and slew rates

Engineering Contradiction:
Improveoutput slew rate adjustmentVSAvoidconsistency of slew rate
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent implements a feedback mechanism where the actual output slew rate is measured and compared with the target slew rate. Based on this comparison, the control circuit adjusts the impedance codes to compensate for manufacturing variability. This closed-loop feedback ensures that the output slew rate consistently meets the desired specification despite variations in transistor parameters during manufacturing.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent dynamically changes the impedance codes based on measured slew rate performance. By adjusting the impedance parameters in response to actual circuit behavior, the system compensates for manufacturing variations. The impedance codes are modified to optimize the driving ability of the gate control part, ensuring consistent output slew rate across different manufacturing batches.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If impedance codes are used to control output impedance, then the driver circuit can be optimized for different loads, but manufacturing variability leads to deviations from desired impedance values

Engineering Contradiction:
Improveoutput impedance controlVSAvoidimpedance value accuracy
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The patent uses feedback to measure the actual output impedance and compare it with the target impedance value. The measured impedance information is fed back to the control circuit, which adjusts the impedance codes to minimize the difference between actual and desired impedance. This ensures accurate impedance control despite manufacturing variations in the driver circuit components.

Inventive Principle:
Principle #23Feedback

3Power

If the gate control part drives multiple output transistors in parallel, then the driving ability can be increased, but variations in transistor parameters cause inconsistent performance

Engineering Contradiction:
Improvedriving abilityVSAvoidperformance consistency
Core Design Contradiction:
PowerVSReliability

Solution Approach 1:

The patent adjusts the impedance codes to optimize the distribution of driving current among the parallel output transistors. By changing the impedance parameters based on measured performance, the system compensates for transistor parameter variations. This ensures that each transistor contributes consistently to the overall driving ability, maintaining reliable and predictable performance.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS8854090B2Driver circuit and semiconductor device
Publication Date: 2014.10.07 FUJITSU LTD
  • US8854090B2 patent drawing
  • US8854090B2 patent drawing
  • US8854090B2 patent drawing

AI summary

A PMOS output stage and an NMOS output stage of which output impedances are controlled in accordance with impedance codes, a gate control part which drives output transistors held by the PMOS output stage and the NMOS output stage, and a slew rate control part which generates bias voltages to control driving ability of the gate control part based on an input current are included, and manufacturing variability of an input current circuit generating an input current is corrected by using the impedance code by the slew rate control part.