Semiconductor Circuit for MOS Transistor Inspection Voltage Control
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Solution Overview
Problem
Existing semiconductor circuits require additional circuits and terminals to apply high voltages to MOS transistors, which can affect the original operation of the MOS transistor.
Innovation Solution
A semiconductor circuit configuration that includes a MOS transistor, operational amplifier, resistors, and a switch, allowing for control of resistance values and inspection voltages without additional circuits or terminals, using a simple configuration that maintains the original operation of the MOS transistor.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If an additional circuit and terminal are used to apply high voltage to the MOS transistor, then the inspection capability is improved, but the device complexity increases
Solution Approach 1:
The gate terminal is designed to serve dual purposes: normal operation control and high voltage inspection. The control circuit can output both normal control voltages and inspection voltages through the same terminal, eliminating the need for a separate inspection terminal and reducing overall device complexity.
Solution Approach 2:
The control circuit is designed to integrate both normal operation control functions and inspection voltage generation functions within a single circuit block. This merging of functions allows the same control circuit to provide both low-voltage control signals and high-voltage inspection signals through the same gate terminal.
2Adaptability or versatility
If an additional circuit is inserted between the protection circuit and gate terminal, then the high voltage inspection is enabled, but the original operation of the MOS transistor is affected
Solution Approach 1:
The control circuit dynamically adjusts its output characteristics based on the operation mode. During normal operation, it provides standard control voltages within the safe operating range of the MOS transistor. During inspection mode, it switches to providing higher inspection voltages. This dynamic behavior allows the same circuit to enable high voltage inspection without permanently affecting or degrading the original operation characteristics.
Solution Approach 2:
The control circuit changes its output voltage parameter based on the operation mode. It can output voltages within the normal operating range during standard operation and switch to outputting higher inspection voltages when needed. This parameter change capability allows the circuit to provide inspection functionality while maintaining the integrity of the original MOS transistor operation characteristics.
3Adaptability or versatility
If an additional terminal is provided for inspection, then the inspection voltage can be applied, but the device complexity increases
Solution Approach 1:
The gate terminal is designed as a universal terminal that accepts both normal control signals and inspection voltage signals. By making the gate terminal multi-functional, the invention eliminates the need for a separate dedicated inspection terminal, thereby reducing the total number of terminals and simplifying the device structure.
Data Source
AI summary
A semiconductor circuit converts an applied input voltage into a desired output voltage and outputs the same from a voltage output terminal. A first resistor, a second resistor, and a third resistor are connected in series between the voltage output terminal and a ground terminal. When a switch is brought to an open state, an output voltage based on a voltage divided by a combined resistance of the second and third resistors and the first resistor is supplied. When the switch is brought to a closed state, an output voltage based on a voltage divided by the second and first resistors is supplied. The semiconductor circuit has a configuration of controlling the resistance value of each voltage division resistor by a control signal from the outside.


