MOSFET Switching State Testing via Voltage Drop Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for testing the switching state of circuit breaker devices connecting or disconnecting voltage networks in vehicles are unreliable and can lead to safety-critical overloads or impairments.
Innovation Solution
A method using a metal-oxide-semiconductor field-effect transistor (MOSFET) switching element with a testing voltage pulse applied to the drain terminal, detecting voltage drops, and comparing them with reference thresholds to determine the actual switching state, ensuring the switching state is not altered by the test and preventing external short circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If existing testing methods are used to test the switching state of circuit breaker devices, then testing can be performed, but the testing is unreliable and can lead to safety-critical overloads or impairments
Solution Approach 1:
The patent applies preliminary action by performing a simulation test before actual operation. The control unit simulates the switching operation of the circuit breaker device in a virtual environment first, detecting potential errors such as overloads or impairments before they occur in the real system. This allows the system to prepare and prevent harmful effects before they manifest in actual operation.
Solution Approach 2:
The patent implements beforehand cushioning by using the simulation test to identify and mitigate potential harmful effects before they occur. The control unit detects errors in the simulation phase and can prevent or cushion against safety-critical overloads and impairments that would otherwise occur during actual switching operations, thereby protecting the system from damage.
2Measurement precision
If a testing voltage pulse is applied to detect the switching state, then the switching state can be detected, but the test could potentially alter the switching state or cause external short circuits
Solution Approach 1:
The patent applies preliminary action by performing simulation tests before actual operation. The control unit simulates the switching operation of the circuit breaker device in a virtual environment first, detecting potential errors such as overloads or impairments before they occur in the real system. This allows the system to prepare and prevent harmful effects before they manifest in actual operation.
Solution Approach 2:
The patent implements beforehand cushioning by using the simulation test to identify and mitigate potential harmful effects before they occur. The control unit detects errors in the simulation phase and can prevent or cushion against safety-critical overloads and impairments that would otherwise occur during actual switching operations, thereby protecting the system from damage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for reliable detection of the switching state of MOSFET switching elements, preventing safety-critical overloads and ensuring the correct operation of circuit breaker devices by determining if the actual state matches the desired state, thus ensuring safe and efficient use of voltage networks.
Implementation Method 1
a source terminal of the at least one MOSFET switching element is in connection with a first of the circuit areas and a drain terminal of the at least one MOSFET switching element is in connection with a second of the circuit areas
Implementation Method 2
detection of a voltage drop between the drain terminal and the source terminal of the at least one MOSFET switching element subjected to the switching state test
Data Source
AI summary
A method tests a switching state of a circuit breaker device (10) for establishing/breaking a connection of two circuit areas (12, 14), especially in a vehicle. The circuit breaker device includes at least one MOSFET switching element (20) with a source terminal (22) connected with one of the circuit areas (12, 14) and a drain terminal (24) connected with another of the circuit areas (12, 14). A gate driver (26) is associated with the switching element (20) for switching into a connection switching state. The method includes applying a testing voltage pulse to the drain terminal, detecting a voltage drop between the drain terminal and the source terminal, comparing the voltage drop detected with a voltage reference or/and with a time reference, and determining, based on the comparison, an actual switching state of the at least one MOSFET switching element (20) being subjected to the switching state test.