Movable Engagement Elements for Semiconductor Test Handler Connection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional test handlers face long changeover times when switching electrical units due to the need for tester conversion and handler exchange, especially when dealing with units of different constructions.
Innovation Solution
A connection system comprising a tester-side and handler-side connection unit with movable engagement elements that securely connect and disconnect, allowing for quick conversion and maintenance, enabling the tester to electrically contact the handler-side circuit board without requiring extensive reconfiguration of the tester.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the tester is reconfigured and handler is replaced when changing electrical units, then the test handler can accommodate different electrical units, but the changeover time increases significantly
Solution Approach 1:
The connection system is divided into separate modular components: a handler-side connection unit with engagement elements and a tester-side connection unit with corresponding engagement elements. This segmentation allows the handler and tester to be independently configured and replaced without affecting each other, enabling quick changeover while maintaining adaptability to different electrical units.
Solution Approach 2:
The connection units are designed with standardized engagement elements that can universally connect different handlers and testers. The handler-side and tester-side connection units feature complementary engagement elements that work together across different configurations, allowing a single connection system design to accommodate multiple electrical units without requiring complete reconfiguration.
2Adaptability or versatility
If the handler is replaced with a new one that accommodates the new electrical unit, then compatibility with the new unit is achieved, but the complexity of the system increases
Solution Approach 1:
The connection system separates the handler-side connection unit from the tester-side connection unit, each with their own engagement elements. This segmentation allows independent replacement and configuration of handlers without affecting the tester, reducing overall system complexity while maintaining compatibility with different electrical units.
Solution Approach 2:
The engagement elements are designed to be movable and adjustable during the connection process. The tester-side engagement elements can move to engage with the handler-side engagement elements, allowing dynamic adaptation to different handler configurations without requiring complex fixed structures.
Data Source
Figure 1
Figure 2
Figure 3
AI summary
One aspect of the invention relates to a connection system (10) for a test handler, in particular a semiconductor test handler, comprising: a tester-side connection unit (14) for arrangement on a tester, a handler-side connection unit (12) for arrangement on a handler, wherein the tester-side connection unit (14) and the handler-side connection unit (12) are connectable to each other, wherein the handler-side connection unit (12) comprises: a handler-side frame (20) having a plurality of handler-side engagement elements (26), wherein the tester-side connection unit (14) comprises: a first tester-side frame (34) having a plurality of tester-side engagement elements (42) which are designed to engage with the plurality of handler-side engagement elements (26), wherein the plurality of tester-side engagement elements (42) are movably formed on the first tester-side frame (34).and wherein, for connecting the connection system (10), the plurality of tester-side engagement elements (42) can be guided such that the plurality of tester-side engagement elements (42) engages with the plurality of handler-side engagement elements (26).