Movable Kikuchi Detector Head for Wider-Angle Super-Resolution Imaging
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Solution Overview
Problem
Current Kikuchi diffraction techniques face limitations in achieving high-quality images with sufficient resolution and large image sections, which hampers accurate analysis of crystal orientation, phase, and strain in materials.
Innovation Solution
A detector system with a movable detector head and control unit, capable of capturing Kikuchi images from different positions, allowing for sub-pixel intensity interpolation and stitching to produce super-resolution images with increased sections, using direct electron detectors or scintillation screens with photodetectors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a fixed detector is used for Kikuchi diffraction, then the device complexity is low, but the image resolution and image section are limited
Solution Approach 1:
The patent applies the dynamics principle by making the detector head movable relative to the sample position. The detector head can be positioned at multiple locations to capture different sections of the electron diffraction cone, enabling super-resolution imaging through stitching multiple images together. This dynamic positioning capability resolves the contradiction by allowing high resolution and large image section without requiring an excessively large fixed detector.
Solution Approach 2:
The patent applies segmentation by dividing the detection process into multiple steps, where the detector captures different sections of the diffraction pattern at different positions. These segmented images are then stitched together to form a complete high-resolution image with extended coverage, effectively resolving the limitation of fixed detector size.
2Area of stationary object
If a large-area detector is used to cover wider solid angle, then the image section increases, but the device complexity and cost increase
Solution Approach 1:
Instead of using a large fixed detector area, the patent employs a smaller detector that moves to different positions. This dynamic approach allows the detector to sample different regions of the electron diffraction cone, achieving wide solid angle coverage without requiring a large detector area, thus resolving the contradiction between detector area and device complexity.
Solution Approach 2:
The patent adds the dimension of time and position by moving the detector through space to capture multiple views of the diffraction pattern. This transforms a single large-area detection problem into a sequence of smaller-area detections at different positions, effectively covering the same solid angle with a smaller detector.
3Area of stationary object
If multiple detectors are used to increase coverage, then the image section increases, but the device complexity increases
Solution Approach 1:
The patent segments the detection task into multiple sequential measurements taken at different detector positions rather than using multiple detectors simultaneously. This approach achieves the same total detection coverage with a single detector, reducing device complexity while maintaining the ability to capture the complete electron diffraction cone.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system enables the acquisition of Kikuchi images with higher resolution and larger sections, enhancing the accuracy of crystal phase and orientation analysis by covering a wider solid angle of the electron diffraction cone.
Implementation Method 1
backscattered or transmitted electrons are diffracted by the periodic atomic lattice within the sample according to the Bragg condition before they exit the sample
Implementation Method 2
electron backscatter diffraction (EBSD) or transmission Kikuchi diffraction (TKD) technique
Implementation Method 3
The detector head comprises a scintillation screen, and the detection unit comprises a photodetector configured to detect incident radiation
Data Source
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Figure 5
AI summary
The present invention refers to a detector (30; 31) and a method for obtaining Kikuchi images by using electron backscatter diffraction (EBSD) or transmission Kikuchi diffraction (TKD) technique. In particular, the present invention refers to a detector (30; 31) comprising a detector body (40), a detector head (50) with a scintillation screen and a photodetector with an active surface (53) for detecting Kikuchi patterns (20), and means configured to move the detector head (50) with respect to the detector body (40). The method comprises obtaining a first and a second Kikuchi pattern, and moving the detector head (50) after obtaining the first Kikuchi pattern and prior to obtaining the second Kikuchi pattern.