Movable Opening Unit for Semiconductor Test Handler
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Solution Overview
Problem
Conventional test handlers face increased production and maintenance costs due to the need for multiple opening units when handling large-sized test trays with more inserts, and require extensive adjustments when switching between different semiconductor devices or testers, leading to inefficiencies and resource wastage.
Innovation Solution
A test handler with a position changing apparatus that allows opening units to move along the test tray, enabling efficient opening of inserts in one area and then moving to another, integrated with a pick-and-place apparatus and a motor-driven system for linear motion, reducing the number of fittings required and simplifying replacements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple opening units are used to handle large-sized test trays with more inserts, then the handling capability is improved, but the production cost and maintenance cost increase
Solution Approach 1:
The opening units are designed to be movable along the test tray rather than fixed in multiple positions. The position changing apparatus enables dynamic repositioning of opening units to match different test tray configurations, reducing the need for multiple static opening units while maintaining adaptability to various insert arrangements
Solution Approach 2:
A single opening unit is designed to perform multiple functions by moving to different positions on the test tray. The same opening unit can service multiple insert locations sequentially, eliminating the need for dedicated opening units at each position and reducing overall system complexity
2Productivity
If multiple opening units are installed for large test trays, then more inserts can be handled, but the maintenance effort increases
Solution Approach 1:
The movable opening units reduce maintenance effort by consolidating components into fewer, reusable units. Instead of maintaining multiple fixed opening units, the system uses fewer units that can be repositioned, reducing the total number of components requiring maintenance while maintaining the same insert handling capacity
3Adaptability or versatility
If extensive adjustments are made when switching between different semiconductor devices or testers, then the system can adapt to different configurations, but the time required and resource wastage increase
Solution Approach 1:
The position changing apparatus enables rapid repositioning of opening units to match different test tray configurations for various semiconductor devices or testers. This dynamic adjustment capability reduces setup time compared to manual reconfiguration, allowing quick adaptation to different testing requirements
Solution Approach 2:
The system automatically positions the opening units based on the test tray configuration, reducing manual intervention and adjustment time. The automated positioning mechanism enables the system to self-adapt to different configurations without extensive manual re adjustment
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution reduces production costs, minimizes maintenance efforts, and facilitates easy adaptation to various types of semiconductor devices and testers by allowing flexible positioning of opening units, thus optimizing the handling of larger test trays and reducing resource wastage.
Implementation Method 1
a motor-driven system for linear motion
Data Source
AI summary
A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.