Movable Probe Platform for Multi-Panel Electrical Testing
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Solution Overview
Problem
The existing manufacturing process of liquid crystal displays requires separate test devices for each type of panel due to differences in test pad design and signal types, leading to increased costs and inefficiencies.
Innovation Solution
A test device with a movable probe platform and scalable test probes, along with a CCD alignment camera, allows for flexible alignment and signal access, enabling a single device to perform electrical tests on various panel types by adjusting probe positions and signal access points based on panel-specific requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate test devices are designed for each panel type, then testing accuracy is ensured, but device complexity and manufacturing cost increase substantially
Solution Approach 1:
The test device is designed with a movable probe platform that can be repositioned to different locations, allowing a single test device to perform electrical tests on multiple types of display panels (GOA mode and non-GOA mode) that previously required separate dedicated test devices. This multi-functional design reduces the total number of test devices needed while maintaining testing accuracy for each panel type.
Solution Approach 2:
The probe platform is designed to be movable rather than fixed, enabling dynamic repositioning of the test probes to match different panel configurations. This dynamic capability allows the same test device to adapt to various panel types with different test pad locations and signal requirements, eliminating the need for multiple static test devices.
2Manufacturing precision
If separate test devices are designed for each panel type, then testing precision is maintained, but manufacturing cost increases
Solution Approach 1:
A single test device with a movable probe platform is designed to handle multiple panel types (GOA and non-GOA modes), eliminating the need to manufacture separate test devices for each panel type. This universal design reduces manufacturing costs while maintaining testing precision through accurate probe positioning and alignment capabilities.
Solution Approach 2:
The test device is designed with modular components, particularly the movable probe platform that can be independently positioned and adjusted. This segmentation allows the same device to be configured for different panel types without requiring complete redesign or remanufacturing, thereby reducing manufacturing costs while preserving testing precision.
3Reliability
If dedicated test devices are used for each panel type, then test reliability is ensured, but productivity decreases due to multiple device requirements
Solution Approach 1:
The movable probe platform enables a single test device to dynamically adapt to different panel types and configurations, allowing continuous testing operations across multiple panel types without requiring physical relocation or replacement of test devices. This increases productivity while maintaining test reliability through consistent positioning and alignment capabilities.
Solution Approach 2:
The test device is designed to universally test both GOA mode and non-GOA mode panels using the same hardware platform, eliminating the need for multiple dedicated devices. This multi-functionality improves productivity by consolidating testing operations into a single device while ensuring reliability through maintained testing precision for each panel type.
4Adaptability or versatility
If multiple test devices are deployed for different panel types, then comprehensive testing coverage is achieved, but device complexity increases
Solution Approach 1:
The probe platform's movable design provides the adaptability needed to achieve comprehensive testing coverage across different panel types without increasing device complexity. The platform can be repositioned and reconfigured for various panel configurations, delivering versatile testing capability through a single unified device rather than multiple complex specialized devices.
Solution Approach 2:
The test device achieves comprehensive testing coverage for both GOA and non-GOA mode panels through its universal design. A single device with movable probes can accommodate different panel types and test configurations, providing extensive testing coverage without the complexity of managing multiple specialized test devices.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables sharing of test devices across different panel types, reducing production costs and improving efficiency by allowing a single device to accommodate varying panel designs and signal configurations.
Implementation Method 1
a spring coupled to one end of the control unit. The spring is arranged at a side of the probe head away from the panel to be tested, and the control unit is arranged at a side of the spring away from the probe head. When the spring is deformed by a pressure of the control unit, the control unit controls the probe head to protrude from the housing and to contact with a test pad on the panel to be tested.
Implementation Method 2
The alignment unit can be a CCD (Charge Coupled Device) alignment camera.
Data Source
AI summary
A test device and a test method are provided. The test device can comprise a movable probe platform, a plurality of signal access points, and a plurality of test probes fixed on the movable probe platform. Each of the plurality of signal access points is correspondingly coupled to one test probe for accessing a corresponding test signal. The plurality of the test probes are configured to contact with test pads on a panel to be tested, and to transmit test signals accessed from the plurality of the signal access points to the test pads, so as to perform an electrical test to the panel to be tested.