Movable Slit X-Ray Analyzer for Higher Wavelength Resolution
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Solution Overview
Problem
Existing X-ray analyzers face challenges in achieving high analysis accuracy without downsizing detection elements, as reducing detection element pitch is technically difficult and leads to manufacturing complexities and increased size.
Innovation Solution
An X-ray analyzer with a movable slit between the sample and analyzing crystal, allowing for two measurements with the slit in different positions to improve wavelength resolution without downsizing detection elements, by moving the slit to alter the incident angle of characteristic X-rays on the analyzing crystal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the detection element pitch is reduced to improve measurement precision, then the analysis accuracy is improved, but the manufacturing precision requirements increase and device complexity increases
Solution Approach 1:
The patent applies the dynamics principle by making the slit movable in the direction intersecting the propagation direction of characteristic X-rays. The slit position can be adjusted between a first position for initial measurement and a second position for supplementary measurement, allowing the system to dynamically adapt and collect additional data without changing the detection element structure or pitch.
2Measurement precision
If the detection element width is reduced to increase the number of detection elements, then the spectral resolution is improved, but the device size increases and manufacturing cost increases
Solution Approach 1:
The patent applies the dimensionality change principle by introducing movement in a new dimension (the slit position along the X-ray propagation direction) to achieve improved spectral resolution. Instead of increasing resolution by reducing detection element width in the horizontal dimension, the system uses vertical dimension movement of the slit to collect additional spectral information, thereby avoiding device miniaturization and size reduction.
3Measurement precision
If the number of measurement points is increased to improve analysis accuracy, then the spectral waveform precision is improved, but the measurement time increases
Solution Approach 1:
The patent applies the preliminary action principle by performing a first measurement with the slit at the first position to obtain initial spectral data, then using the drive unit to move the slit to the second position for supplementary measurement. This staged approach allows the system to collect comprehensive spectral information efficiently by preparing initial data first and then adding complementary measurements, improving analysis accuracy without excessive time loss.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances analysis accuracy by interpolating wavelengths that were not measurable in the initial measurement, resulting in a more precise spectral waveform without the need for smaller detection elements, while maintaining analyzer size and intensity.
Implementation Method 1
an analyzing crystal configured to diffract characteristic X-rays emitted from the sample irradiated with the excitation beam for each wavelength
Implementation Method 2
an excitation source configured to irradiate a sample with an excitation beam... the sample irradiated with the excitation beam generates characteristic X-rays
Data Source
AI summary
An X-ray analyzer is provided with an excitation source configured to irradiate a sample with an excitation beam, an analyzing crystal configured to diffract characteristic X-rays emitted from the sample irradiated with the excitation beam for each wavelength, a line detector having a plurality of detection elements each arranged to detect an intensity of each of the plurality of wavelengths diffracted by the analyzing crystal, a slit arranged between the sample and the analyzing crystal, an actuator configured to move the slit in a direction intersecting a propagation direction of the characteristic X-rays passing through the slit, and a controller. The controller analyzes the sample using a measurement result when the slit is in an initial position and a measurement result when the slit has been moved from the initial position by a predetermined amount.