Movable Testing Socket Locking to Cut Downtime and Collision Risk
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Solution Overview
Problem
Existing electronic component testing apparatuses require shutdown for socket replacement, are labor-intensive for maintenance, and pose high risks of collision and inefficiency due to excessive component movement during testing.
Innovation Solution
An electronic component testing apparatus with a controller, transferring device, testing socket, and workpress, allowing the testing socket to be locked and moved with a workpress to reduce movement times and protect components, enabling socket replacement without shutdown and facilitating cleaning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the testing socket is fixed on the testing machine, then the testing structure is stable, but the apparatus must be shut down for socket replacement and maintenance, reducing productivity
Solution Approach 1:
The testing socket is transformed from a fixed structure to a movable one, mounted on a transferable carrier that can be dynamically positioned between testing and maintenance locations. This allows the socket to be moved without shutting down the apparatus, resolving the contradiction between structural stability and productivity.
Solution Approach 2:
The testing socket is separated from the main testing machine body and mounted on an independent carrier. This segmentation allows the socket to be independently transferred for maintenance while the main apparatus continues operating, improving productivity without compromising testing stability.
2Ease of repair
If the testing socket is removed for cleaning and maintenance, then maintenance can be performed, but it is time-consuming and labor-intensive, reducing efficiency
Solution Approach 1:
A carrier acts as an intermediary between the testing socket and the maintenance personnel. The carrier can be transferred to a maintenance station where cleaning and repairs are performed, reducing the time and effort required compared to removing the socket directly from the fixed apparatus.
Solution Approach 2:
The testing socket is mounted on a movable carrier that can be dynamically transferred to maintenance positions, enabling quick access for cleaning and repairs without requiring complete disassembly or shutdown of the testing apparatus, thus reducing maintenance time and labor intensity.
3Ease of operation
If the electronic component is moved multiple times during testing, then the component can be transferred between areas, but excessive movement increases collision risk and reduces testing efficiency
Solution Approach 1:
The electronic component, testing socket, and carrier are merged into a single integrated transfer unit. The component remains loaded in the socket throughout the transfer process, eliminating intermediate handling steps and reducing collision risk while maintaining transfer capability between areas.
Solution Approach 2:
The electronic component is preliminarily loaded into the testing socket before the transfer process begins. This preliminary action ensures the component is securely positioned and protected during subsequent transfers, reducing the risk of collision or falling compared to transferring the component separately.
Data Source
AI summary
An electronic component testing apparatus includes a controller, a transferring device, a testing socket, a workpress, and a testing board. The testing socket loads an electronic component. The controller is electrically connected to the transferring device, the workpress, and the testing board. In response to the transferring device transferring the testing socket to a testing area, the controller controls the workpress to press against the testing socket, and controls a locking mechanism of the workpress to lock the testing socket. In response to the locking mechanism locking the testing socket, the controller controls the workpress to move the testing socket on the testing board.