MRAM Stack Structure With Spin-Orbit Coupling for Compact Sensing

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Solution Overview

Problem

Existing magnetic field sensor technologies face issues such as high chip area, high cost, high power consumption, limited sensitivity, and susceptibility to temperature variations.

Innovation Solution

A magnetic random access memory (MRAM) structure is developed with a specific layered configuration including a substrate, dielectric layers, conductive vias, bottom and top electrode layers, a spin orbit coupling layer, and protective and spacer layers, utilizing materials like silicon nitride and tungsten to enhance performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of moving object

If conventional magnetic field sensor technologies (AMR, GMR, MTJ sensors) are used, then sensing functionality is achieved, but chip area is large and cost is high

Engineering Contradiction:
Improvechip areaVSAvoidsensing functionality
Core Design Contradiction:
Area of moving objectVSReliability

Solution Approach 1:

The patent applies multi-functionality by integrating both memory and sensing functions into a single MTJ-based structure. The same MTJ cell that stores data magnetically also serves as the sensing element, eliminating the need for separate sensor components and thereby reducing chip area while maintaining full sensing functionality.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The invention merges the memory storage function and sensor detection function into a unified structure. The MTJ element simultaneously performs data storage through magnetic states and sensing through resistance measurement, combining what were previously separate functional blocks into one compact unit.

Inventive Principle:
Principle #5Merging (Combining)

2Use of energy by moving object

If conventional magnetic field sensor technologies are used, then sensing capability is provided, but power consumption is high

Engineering Contradiction:
Improvepower consumptionVSAvoidsensing capability
Core Design Contradiction:
Use of energy by moving objectVSReliability

Solution Approach 1:

The MTJ structure utilizes spin-transfer torque where the read current itself generates the spin polarization needed for sensing, eliminating the need for separate polarization generation circuits. The system serves itself by using the measurement current to create the necessary quantum mechanical effects for detection.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces conventional mechanical or electromagnetic sensing mechanisms with quantum mechanical spin-based detection. The spin-dependent transport effect allows for ultra-low power operation since it relies on electron spin properties rather than large-scale electromagnetic fields or mechanical movements.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If conventional magnetic field sensor technologies are used, then magnetic field detection is achieved, but sensitivity is limited

Engineering Contradiction:
ImprovesensitivityVSAvoiddevice structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention changes the fundamental detection parameter from classical magnetic field measurement to quantum spin-dependent resistance measurement. By utilizing the TMR effect where resistance changes dramatically with magnetic state, the system achieves ultra-high sensitivity that far exceeds conventional sensor capabilities.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs composite material structures within the MTJ stack, combining ferromagnetic layers, tunnel barriers, and spin-orbit coupling materials to create a system with enhanced sensitivity. The multi-layer composite structure enables both high sensitivity detection and stable operation.

Inventive Principle:
Principle #40Composite materials

4Reliability

If conventional magnetic field sensor technologies are used, then sensing operation is enabled, but performance is easily affected by temperature variation

Engineering Contradiction:
Improvetemperature stabilityVSAvoidsensing operation
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The patent changes the operating principle to rely on magnetic anisotropy and spin-dependent transport which are inherently more temperature-stable than conventional sensing mechanisms. The MTJ resistance ratio remains relatively constant across temperature variations, providing stable operation without complex compensation circuits.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention uses a simplified single-cell structure that does not require complex temperature compensation mechanisms or multiple redundant sensors. The inherent stability of the MTJ physics allows the system to operate reliably without expensive or complex temperature management infrastructure.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The MRAM structure reduces chip area, lowers power consumption, and improves sensitivity while being less affected by temperature variations, offering an improved alternative to existing technologies.

Implementation Method 1

a spin orbit coupling layer disposed on the bottom electrode layer

Methodology Applied
Scientific EffectSpin Hall Effect:

Implementation Method 2

The physical definition of such effect is defined as a variation in resistance obtained by dividing a difference in resistance under no magnetic interference by the original resistance

Methodology Applied
Scientific EffectMagnetoresistance effect: Magnetoresistance

Data Source

PatentUS12464956B2Magnetic random access memory structure and fabrication method thereof
Publication Date: 2025.11.04 UNITED MICROELECTRONICS CORP
  • US12464956B2 patent drawing
  • US12464956B2 patent drawing
  • US12464956B2 patent drawing

AI summary

A magnetic random access memory structure includes a first dielectric layer, a bottom electrode layer disposed on the first dielectric layer; a spin orbit coupling layer disposed on the bottom electrode layer; a magnetic tunneling junction (MTJ) element disposed on the spin orbit coupling layer; a top electrode layer disposed on the MTJ element; a protective layer surrounding the MTJ element and the top electrode layer, and the protective layer masking the spin orbit coupling layer; a mask layer surrounding the protective layer, and a spacer layer surrounding the mask layer and the protective layer.