3D Magnetic Tunnel Junction Array Vertical Stacking

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Solution Overview

Problem

The challenge is to increase device density in electronic devices while maintaining chip size and technology node, as shrinking line width, pitch, and film thickness approaches physical limits, necessitating a new design to enhance storage capacity and reduce costs.

Innovation Solution

The design incorporates a 3D magnetic tunnel junction array with a U-shaped free layer and tunnel layer sandwiched between electrodes, featuring through holes and trenches to create vertically stacked magnetic tunnel junctions, allowing for increased density without increasing chip size.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If line width, pitch and film thickness are shrunk to increase device density, then device density is improved, but manufacturing precision and reliability deteriorate as physical limits are approached

Engineering Contradiction:
Improvedevice densityVSAvoidmanufacturing precision
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The patent transitions from planar 2D magnetic tunnel junctions to vertically stacked 3D structures. Multiple MTJ cells are arranged in tiers along the vertical direction, with first electrodes extending through substrates and second electrodes positioned at different heights. This dimensional change allows significant increase in storage capacity without further shrinking lateral dimensions, thereby avoiding the manufacturing precision deterioration that occurs at physical size limits.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If line width, pitch and film thickness are shrunk to increase device density, then device density is improved, but chip size must be reduced

Engineering Contradiction:
Improvedevice densityVSAvoidchip size
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The invention utilizes the vertical dimension to stack multiple MTJ cell tiers (e.g., four tiers with 64 cells each, totaling 256 cells) within the same chip footprint. First electrodes extend through the substrate while second electrodes are positioned at different vertical levels, enabling high-density storage without reducing the horizontal chip area. This allows increased device density while maintaining or even expanding chip size for higher total capacity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Quantity of substance

If technology node is reduced to increase device density, then device density is improved, but manufacturing complexity and cost increase

Engineering Contradiction:
Improvedevice densityVSAvoiddevice complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent divides the magnetic tunnel junction structure into distinct segmented components: first electrodes extending through substrates, second electrodes at different levels, and multiple MTJ cells arranged in tiers. Each component can be independently fabricated and positioned, simplifying the manufacturing process compared to monolithic miniaturization. This segmentation approach increases device density while managing manufacturing complexity through modular assembly rather than requiring proportionally more complex processing at smaller technology nodes.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables higher storage density and reduced costs by efficiently stacking magnetic tunnel junctions, maintaining chip size while enhancing storage capacity and reducing costs per chip.

Implementation Method 1

Tunnel magnetoresistance (TMR) effect was discovered in 1975. This effect was observed in a magnetic tunnel junction consisting of two ferromagnets and a tunnel barrier sandwiched between the two ferromagnets.

Methodology Applied
Scientific EffectTunnel magnetoresistance (TMR) effect: Magnetoresistance

Data Source

PatentUS9721990B2Magnetic tunnel junction and 3-D magnetic tunnel junction array
Publication Date: 2017.08.01 LIN YEU CHUNG
  • US9721990B2 patent drawing
  • US9721990B2 patent drawing
  • US9721990B2 patent drawing

AI summary

A magnetic tunnel junction cell includes a first electrode having an axis extending in a direction substantially perpendicular to an active surface of a substrate. The magnetic tunnel junction further includes a fixed layer, a U-shaped free layer, a tunnel layer sandwiched between the fixed layer and the U-shaped free layer and a second electrode embedded in the U-shaped free layer. The fixed layer, the tunnel layer and the U-shaped free layer are disposed between the first electrode and the second electrode and constitute a magnetic tunnel junction. The tunnel layer may also be U-shaped.