MTJ Memory Layout With Multiferroic Cells for Speed and Retention

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Solution Overview

Problem

Existing semiconductor memory devices face challenges in achieving both high-speed operation and low power consumption, particularly in magnetic memory devices with magnetic tunnel junctions, which require improvements in data storage and retrieval efficiency.

Innovation Solution

A magnetic memory device is designed with a single chip incorporating magnetic tunnel junction patterns that have different operation characteristics, including a multiferroic pattern with ferroelectricity and antiferromagnetism, to enhance thermal stability and retention characteristics while maintaining high switching speed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If a magnetic tunnel junction pattern is designed for high-speed operation, then switching speed is improved, but retention characteristics deteriorate

Engineering Contradiction:
Improveswitching speedVSAvoidretention characteristics
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The magnetic memory device is divided into multiple regions with different magnetic tunnel junction patterns. Some regions use conventional MTJ patterns optimized for fast switching, while other regions use MTJ patterns with multiferroic patterns optimized for high retention. This segmentation allows each region to specialize in one function, resolving the contradiction between speed and retention.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different local regions of the magnetic memory device are given different qualities and characteristics. Specifically, certain regions incorporate multiferroic patterns that provide enhanced retention, while other regions maintain simpler structures for faster switching. This local differentiation allows the device to simultaneously achieve both high-speed operation and high retention characteristics in different areas.

Inventive Principle:
Principle #3Local quality

2Reliability

If a magnetic tunnel junction pattern is designed for high retention characteristics, then data storage reliability is improved, but switching speed deteriorates

Engineering Contradiction:
Improveretention characteristicsVSAvoidswitching speed
Core Design Contradiction:
ReliabilityVSSpeed

Solution Approach 1:

The magnetic memory device is divided into multiple regions with different magnetic tunnel junction patterns. Some regions use conventional MTJ patterns optimized for fast switching, while other regions use MTJ patterns with multiferroic patterns optimized for high retention. This segmentation allows each region to specialize in one function, resolving the contradiction between speed and retention.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different local regions of the magnetic memory device are given different qualities and characteristics. Specifically, certain regions incorporate multiferroic patterns that provide enhanced retention, while other regions maintain simpler structures for faster switching. This local differentiation allows the device to simultaneously achieve both high-speed operation and high retention characteristics in different areas.

Inventive Principle:
Principle #3Local quality

3Adaptability or versatility

If multiple magnetic tunnel junction patterns with different characteristics are integrated in a single chip, then device functionality is improved, but device complexity increases

Engineering Contradiction:
Improvedevice functionalityVSAvoiddevice complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The magnetic memory device is divided into multiple regions with different magnetic tunnel junction patterns. Some regions use conventional MTJ patterns optimized for fast switching, while other regions use MTJ patterns with multiferroic patterns optimized for high retention. This segmentation allows each region to specialize in one function, resolving the contradiction between speed and retention.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The magnetic memory device is designed to perform multiple functions by integrating different types of magnetic tunnel junction patterns in a single chip. The device can simultaneously provide high-speed random access memory functionality in some regions and high-retention non-volatile memory functionality in other regions, achieving multi-functionality without requiring separate devices.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The design allows for higher retention characteristics in some memory cells and faster switching in others, optimizing the performance of the magnetic memory device by providing both high-speed random access and non-volatile memory capabilities.

Implementation Method 1

The multiferroic pattern has ferroelectricity and antiferromagnetism

Methodology Applied
Scientific EffectFerroelectricity:

Implementation Method 2

The multiferroic pattern has ferroelectricity and antiferromagnetism

Methodology Applied
Scientific EffectAntiferromagnetism:

Implementation Method 3

a fourth magnetic pattern 142 and a second tunnel barrier pattern 146 between the third magnetic pattern 122 and the fourth magnetic pattern 142

Methodology Applied
Scientific EffectMagnetic anisotropy: Anisotropy

Implementation Method 4

A resistance value of the magnetic tunnel junction pattern may be changed depending on magnetization directions of the two magnetic bodies

Methodology Applied
Scientific EffectMagnetoresistance: Magnetoresistance

Implementation Method 5

a first tunnel barrier pattern between the first fixed magnetic structure and the first free magnetic structure

Methodology Applied
Scientific EffectMagnetic tunneling:

Data Source

PatentUS20250331427A1Magnetic memory device
Publication Date: 2025.10.23 SAMSUNG ELECTRONICS CO LTD
  • US20250331427A1 patent drawing
  • US20250331427A1 patent drawing
  • US20250331427A1 patent drawing

AI summary

A magnetic memory device is provided. The device includes: a first magnetic tunnel junction pattern on a first region of a substrate and a second magnetic tunnel junction pattern on a second region of the substrate. The first magnetic tunnel junction pattern includes a first fixed magnetic structure, a first free magnetic structure, and a first tunnel barrier pattern between the first fixed magnetic structure and the first free magnetic structure. The second magnetic tunnel junction pattern includes a second fixed magnetic structure, a second free magnetic structure, a second tunnel barrier pattern, and a multiferroic pattern. The second tunnel barrier pattern is between the second fixed magnetic structure and the second free magnetic structure. The second free magnetic structure is between the second tunnel barrier pattern and the multiferroic pattern. The multiferroic pattern has ferroelectricity and antiferromagnetism, and is selectively provided to the second magnetic tunnel junction pattern.