MU Sampling Clock Phase Control for Temperature-Accurate Measurement
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Solution Overview
Problem
Existing merging units (MUs) in power systems face challenges in accurately measuring voltage and current signals at a sampling command time due to phase angle delays and temperature-induced changes, which current correction methods fail to adequately address.
Innovation Solution
A measured waveform phase control device and method that incorporates a temperature sensor, oscillator element, and analog-digital converter (ADC) to adjust the sampling clock based on ambient temperature and oscillation speed, enabling precise phase correction of voltage and current signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If phase correction is applied to reduce delay time, then measurement accuracy at sampling command time is improved, but temperature-induced changes in oscillator element characteristics cause correction accuracy to deteriorate
Solution Approach 1:
The system performs preliminary phase correction by measuring and storing delay time characteristics at room temperature before actual operation. This pre-established correction data serves as a baseline that can be adjusted based on temperature conditions during operation, allowing the system to prepare correction parameters in advance while maintaining adaptability to temperature changes.
Solution Approach 2:
The system changes the correction parameters based on temperature conditions. By detecting ambient temperature and comparing it with room temperature baseline data, the system adjusts the phase correction values to compensate for temperature-induced oscillator drift, thereby maintaining measurement accuracy across varying temperature conditions.
2Measurement precision
If delay time characteristics are corrected at room temperature, then phase alignment is improved under normal conditions, but measurement accuracy deteriorates when temperature changes occur
Solution Approach 1:
The system implements feedback by continuously monitoring ambient temperature and using this information to adjust phase correction parameters. The temperature detection unit provides real-time temperature data, which feeds back to the sampling clock providing unit to modify correction values dynamically, ensuring reliable measurements despite temperature fluctuations.
Solution Approach 2:
The system transitions from static room-temperature correction to dynamic temperature-adaptive correction. By making the correction parameters variable based on temperature conditions rather than fixed at room temperature values, the system adapts its behavior to maintain reliability across different thermal environments.
3Loss of time
If sampling clock timing is adjusted for delay compensation, then accurate sampling at command time is achieved, but temperature-induced oscillator speed changes cause timing errors
Solution Approach 1:
The temperature detection unit acts as an intermediary between the oscillator element and the sampling clock providing unit. It detects temperature conditions and transmits this information to enable adjustment of sampling timing, serving as a mediator that allows the system to compensate for temperature-induced oscillator variations without directly modifying the oscillator itself.
Solution Approach 2:
The system changes the sampling clock timing parameters based on temperature detection. By adjusting the sampling clock phase or frequency according to ambient temperature conditions, the system compensates for oscillator speed variations and maintains accurate sampling timing across different temperature environments.
Data Source
AI summary
Provided is a measured waveform phase control device and method of a merging unit (MU) which obtains an accurate value at a sampling command time, corrects characteristics of a change in temperature of an oscillator element, and also corrects delay characteristics of an analog sensing element at the sampling command time. A measured waveform phase control device of an MU of the present invention includes a temperature sensor which provides ambient temperature information, an oscillator element which provides an oscillation signal, an analog-digital converter (ADC) which samples an analog current sensing signal or voltage sensing signal as a digital signal, and a sampling clock providing part which provides a sampling clock to the ADC on the basis of the ambient temperature information and the oscillation signal under control of a sampling request part.