Multi-ADC Residue Conversion for Fault-Tolerant Two-Input Sampling
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Solution Overview
Problem
Analog-to-digital converters (ADCs) currently provide only one numerical parameter for two-input analog signals, making it difficult to detect false representations of strain parameters, which can lead to damage and injuries in digital control systems.
Innovation Solution
The implementation of a system with multiple ADC circuits that provide multiple numerical parameters, including differences and weighted representations of the analog quantities, allowing for more robust and flexible fault detection and prevention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single ADC circuit provides one numerical parameter for two-input analog signals, then the device complexity is low, but the reliability and fault detection capability are insufficient
Solution Approach 1:
The patent divides the conversion of two-input analog signals into separate conversion processes. Instead of directly converting the differential signal (V1-V2) alone, the system segments the conversion into multiple stages: first converting V1 to code1 with residue1, then converting V2 to code2 with residue2, and finally converting the difference of residues (residue1-residue2) to code3. This segmentation allows multiple parameters to be obtained from multiple ADC circuits, improving reliability and fault detection capability.
Solution Approach 2:
The patent transitions from a single-dimension output (one numerical parameter D) to a multi-dimensional output by providing multiple numerical parameters (code1, code2, code3) from multiple ADC circuits. This dimensional expansion enables the system to detect false representations and faults by comparing multiple parameters, thereby improving reliability without merely increasing the number of circuits without purpose.
2Reliability
If multiple ADC circuits are used to provide multiple numerical parameters, then the reliability and fault detection capability are improved, but the device complexity increases
Solution Approach 1:
The patent segments the fault detection function across multiple ADC circuits, where each circuit provides specific parameters (code1, code2, code3) that collectively enable comprehensive fault detection. This segmentation allows the system to achieve high reliability and fault tolerance by distributing the conversion and detection functions across multiple specialized circuits rather than using a single complex circuit.
Data Source
AI summary
An analog-to-digital converter (ADC) system configured to receive a first and a second analog quantity and to provide a plurality of numerical parameters representative of the first and second analog quantities. The ADC system includes a first, a second, and a third ADC circuit, and a digital interface circuit. The first ADC circuit is configured to provide a first code representative of the first analog quantity and to provide a first analog residue quantity representative of the first analog quantity with respect to the first code. The second ADC circuit is configured to provide a second code representative of the second analog quantity and to provide a second analog residue quantity representative of the second analog quantity with respect to the second code. The third ADC circuit is configured to receive the first and second analog residue quantities, and to provide a third digital code representative of a difference of the first and second analog residue quantities. The digital interface circuit is configured to receive the first, second, and third codes, and to provide the plurality of numerical parameters representative of the first and second analog quantities.