Multi-Angle Gas Supply for Semiconductor Film Thickness Control

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Solution Overview

Problem

Existing substrate processing technologies face challenges in achieving precise control over the thickness distribution of films formed on substrates, particularly in semiconductor device manufacturing.

Innovation Solution

A substrate processing apparatus is designed with a gas supply system that includes multiple gas supply ports to supply process gases to the substrate from different directions, allowing for improved control over the film thickness distribution by adjusting the gas flow angles and ratios.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a single gas supply port is used to supply process gas to the substrate, then the device complexity is reduced, but the manufacturing precision of film thickness distribution deteriorates

Engineering Contradiction:
Improvefilm thickness distribution controlVSAvoidgas supply system structure
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The gas supply system is segmented into multiple gas supply ports (first gas supply port and second gas supply port) positioned at different locations and orientations relative to the substrate. Each port supplies process gas along different directions, enabling independent control of gas flow to different regions of the substrate, thereby achieving precise film thickness distribution control

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the substrate receive process gas with different characteristics through the multiple gas supply ports. The first gas supply port supplies gas along a direction more inclined toward the radial direction, while the second gas supply port supplies gas along a direction more inclined toward the tangential direction, creating locally optimized gas flow patterns for different substrate regions to achieve uniform film thickness

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If multiple gas supply ports are used to improve film thickness uniformity, then the manufacturing precision is improved, but the device complexity increases

Engineering Contradiction:
Improvethickness distribution uniformityVSAvoidgas supply system configuration
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The gas supply system employs asymmetric positioning and orientation of gas supply ports relative to the substrate. The first gas supply port is positioned and oriented to supply gas with a flow direction more inclined toward the radial direction, while the second gas supply port is positioned and oriented to supply gas with a flow direction more inclined toward the tangential direction, creating an asymmetric but balanced gas distribution pattern

Inventive Principle:
Principle #4Asymmetry

Solution Approach 2:

The gas supply system adds dimensional complexity by introducing gas supply from multiple spatial directions rather than from a single point. The first gas supply port supplies gas along a direction more inclined toward the radial direction, while the second gas supply port supplies gas along a direction more inclined toward the tangential direction, creating a three-dimensional gas flow pattern that enhances film thickness uniformity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus enhances the controllability of film thickness distribution, enabling the adjustment of film thickness from central convex to flat or central concave distributions, thereby improving the uniformity and quality of semiconductor films.

Implementation Method 1

a process chamber in which a substrate is capable of being accommodated; and a gas supply system configured to supply a first process gas into the process chamber

Methodology Applied
Scientific EffectChemical Vapour Deposition: Chemical Vapour Deposition

Data Source

PatentUS12266522B2Substrate processing apparatus, method of manufacturing semiconductor device and non-transitory computer-readable recording medium
Publication Date: 2025.04.01 KOKUSAI DENKI KK
  • US12266522B2 patent drawing
  • US12266522B2 patent drawing
  • US12266522B2 patent drawing

AI summary

Described herein is a technique capable of improving the controllability of firm thickness distribution. According to one aspect of the technique, there is provided a substrate processing apparatus including: a process chamber; a first and a second gas supply system; an exhaust system; and a controller for controlling the first and the second gas supply system and the exhaust system to form a film. The first gas supply system includes: a first and a second storage part; a first gas supply port for supplying a gas stored in the first storage part from an outer periphery toward a center of a substrate; and a second gas supply for supplying the gas stored in the second storage part from the outer periphery along a direction more inclined toward the outer periphery than a direction from the outer periphery toward the center of the substrate.