Multi-Angle Illumination Layout for Single-Shot Gloss Inspection
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Solution Overview
Problem
Existing appearance inspection methods struggle with detecting gloss unevenness and require multiple captures or compromise accuracy when inspecting large regions or multiple objects, especially due to challenges in capturing specular reflection components.
Innovation Solution
An inspection apparatus and method that uses a plurality of light sources arranged to create virtual images surrounding the inspection region, allowing for simultaneous high-accuracy image capture and inspection by synchronizing light source activation with image capture.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple ring illumination devices are used to capture images for inspection, then the inspection accuracy for gloss unevenness is improved, but the inspection time increases
Solution Approach 1:
The patent combines multiple illumination devices into a single integrated illumination unit that can emit light from multiple directions simultaneously. This merging approach allows the system to capture reflected light components from different angles in a single image, achieving the same inspection accuracy as multiple separate captures while reducing inspection time.
Solution Approach 2:
The illumination devices are configured to emit light in specific periodic patterns or sequences that allow the image capturing apparatus to capture all necessary reflected light components in one shot. By coordinating the illumination timing and angles, the system achieves comprehensive coverage without requiring multiple sequential captures.
2Area of stationary object
If the ring illumination devices have a large diameter to inspect large regions, then the inspection coverage is improved, but the device complexity and size increase
Solution Approach 1:
The illumination system is divided into multiple independent illumination devices arranged in specific patterns. Each device can be of manageable size, but collectively they provide wide coverage. This segmentation allows the system to inspect large regions without requiring a single oversized illumination device.
Solution Approach 2:
The patent arranges multiple illumination devices in three-dimensional space around the inspection target, utilizing vertical and angular dimensions in addition to horizontal spread. This spatial arrangement enables comprehensive coverage of large inspection regions while keeping individual device sizes compact.
3Area of stationary object
If multiple ring illumination devices are used to ensure coverage of large inspection regions, then the inspection coverage is improved, but the number of captures required increases
Solution Approach 1:
Multiple illumination devices are merged into a coordinated system that operates simultaneously, with each device contributing to capturing different reflected light components. This allows the system to cover large inspection regions and capture all necessary image data in a single capture operation, maintaining high productivity.
Solution Approach 2:
The illumination devices are designed with multi-functionality, where each device can serve multiple purposes: providing illumination from different angles, capturing different reflected light components, and contributing to both gloss unevenness detection and general surface inspection. This universality reduces the total number of captures needed.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-accuracy inspection of large or multiple regions with a single image capture, improving efficiency and reducing the need for multiple captures.
Implementation Method 1
a plurality of light sources configured to emit light to an inspection region
Implementation Method 2
gloss unevenness, which is a difference in gloss intensity among regions, is characterized in that it is not easily detected when specular reflected light is directly received, and is easily detected when a reflection component in the vicinity of the specular reflected light is received
Data Source
AI summary
An inspection apparatus comprises a plurality of light sources configured to emit light to an inspection region, an image capturing apparatus configured to capture an image of the inspection region irradiated with light from at least some of the plurality of light sources, at least one memory, and at least one processor. The at least one memory and the at least one processor are configured to perform inspection related to the inspection region based on a captured image obtained by the capturing. The plurality of light sources are arranged at positions where virtual images corresponding to the light sources surround the inspection region.