Multi-Angle Illumination Inspection System for Embossed Surfaces
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Solution Overview
Problem
Conventional inspection systems struggle to simultaneously illuminate and capture images of both the side and upper faces of three-dimensional shape objects with embossing, as well as handle regular reflection lights, which hinders effective inspection.
Innovation Solution
An inspection system comprising a first lighting device irradiating light from a given direction, a second lighting device positioned obliquely between the first device and the object, and an image capture device aligned along the same direction, capturing images from both lighting devices to synthesize a comprehensive inspection image.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a plurality of light sources are arranged in the same plane to irradiate light onto three-dimensional shape objects, then the structure is simple, but the side face and upper face cannot be simultaneously illuminated
Solution Approach 1:
The patent transitions from a two-dimensional planar arrangement of light sources to a three-dimensional spatial arrangement. Specifically, light sources are positioned at different heights and angles relative to the object surface, enabling simultaneous illumination of both side faces and upper faces that cannot be achieved from a single plane.
2Shape
If the surface of the object is applied with embossing, then the product design is enhanced, but regular reflection lights in different directions prevent capture of suitable inspection images
Solution Approach 1:
The patent applies different illumination conditions to different regions of the embossed surface. By positioning multiple light sources at specific angles and heights, each region of the embossed surface receives optimized illumination that minimizes unwanted regular reflection while highlighting inspection-relevant features.
Solution Approach 2:
The patent converts the harmful effect of regular reflection from embossed surfaces into a beneficial inspection signal. By strategically positioning light sources, the regular reflection is directed toward the image capture device, causing embossed features to appear as bright highlights that clearly indicate their position and shape for inspection purposes.
3Loss of information
If multiple images are captured by changing positions of illumination light source, then comprehensive inspection data is obtained, but inspection time increases
Solution Approach 1:
The patent merges multiple illumination functions into a single inspection step. By arranging multiple light sources at different positions and angles within the same inspection system, all necessary illumination angles are provided simultaneously, allowing comprehensive inspection data to be captured in one image rather than requiring multiple sequential images.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables simultaneous illumination and imaging of both faces of three-dimensional objects with embossing, effectively capturing inspection images despite regular reflection, enhancing inspection efficiency and accuracy.
Implementation Method 1
a first lighting device configured to irradiate light onto the inspection target from a given direction
Implementation Method 2
a second lighting device, provided between the inspection target and the first lighting device, configured to irradiate light onto the inspection target from an oblique direction with respect to the given direction
Implementation Method 3
If the surface of the object to be inspected (inspection target object) is applied with embossing, regular reflection lights in different directions
Data Source
AI summary
An inspection system for inspecting a target includes a first lighting device configured to irradiate light onto the target from a given direction; a second lighting device, provided between the target and the first lighting device, configured to irradiate light onto the target from an oblique direction with respect to the given direction; an image capture device, provided at a position opposite to a position of the target with respect to the first lighting device and the second lighting device in the given direction; and circuitry configured to acquire a first inspection target image of the target, captured by the image capture device by irradiating the light from the first lighting device, and a second inspection target image of the target, captured by the image capture device by irradiating the light from the second lighting device, to be used for inspecting the target.