Multi-Axis Antenna Test Rig for Low-Interference mmWave Measurement

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Solution Overview

Problem

Existing testing systems struggle to accurately calibrate and measure the radiation patterns of mmWave and THz-frequency antennas in various configurations and orientations, particularly due to interference from reflective surfaces and the sensitivity of high-frequency signals.

Innovation Solution

A multi-axis testing apparatus is employed, utilizing a base portion, arm portion, and platform portion to rotate the DUT around Azimuth, Elevation, and Polarization axes, with non-reflective materials and passthrough holes for wiring to minimize interference, and a frequency extender for higher frequencies.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If reflective surfaces are used in the testing environment, then structural integrity and ease of construction are improved, but signal interference and measurement accuracy deteriorate

Engineering Contradiction:
Improveease of constructionVSAvoidsignal interference
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The patent applies anechoic chamber design with absorptive materials that convert harmful reflective signals into beneficial non-reflective conditions. The absorptive lining transforms the problematic reflections into controlled signal absorption, enabling accurate mmWave and THz measurements while maintaining a functional testing space.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The patent creates an electromagnetic inert environment through anechoic chamber construction with signal-absorbing materials. This inert environment prevents unwanted electromagnetic reflections and interactions, allowing clean measurement of the device under test without interference from the surrounding structure.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

2Adaptability or versatility

If multi-axis rotation capability is added to test various configurations, then adaptability and measurement completeness are improved, but device complexity increases

Engineering Contradiction:
Improvemeasurement capabilityVSAvoidapparatus complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent divides the rotation mechanism into three independent rotational axes (azimuth, elevation, and polarization axes). Each axis can be controlled separately, allowing the DUT to be positioned in various orientations. This segmentation enables comprehensive measurement of radiation patterns while keeping each individual axis mechanism relatively simple.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The multi-axis rotation system serves multiple functions: it can test antennas in different orientations, calibrate phased arrays, and measure radiation patterns comprehensively. A single integrated rotation mechanism performs all these tasks, reducing the need for separate testing apparatus for each configuration.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If frequency extender is used for mmWave and THz frequencies, then measurement accuracy for high-frequency signals is improved, but signal loss and interference increase

Engineering Contradiction:
Improvehigh-frequency measurement accuracyVSAvoidsignal loss
Core Design Contradiction:
Measurement precisionVSLoss of energy

Solution Approach 1:

The frequency extender acts as an intermediary device that converts lower-frequency test signals into mmWave and THz frequencies for the DUT, and vice versa for measurement. This mediator enables the use of existing test equipment to measure high-frequency antennas without requiring direct generation of high-frequency signals, reducing signal loss and interference.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The frequency extender changes the operating frequency parameter by upconverting test signals to mmWave and THz bands. This parameter transformation allows accurate measurement of high-frequency antenna characteristics while using more stable lower-frequency test signals, reducing the impact of signal loss and interference during testing.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS12553933B2Multi-axis test equipment
Publication Date: 2026.02.17 MILLIWAVE SILICON SOLUTIONS INC
  • US12553933B2 patent drawing
  • US12553933B2 patent drawing
  • US12553933B2 patent drawing

AI summary

Embodiments herein relate to a testing apparatus for coupling with a device-under-test (DUT). The apparatus may include a base portion configured to couple to a testing platform, wherein the base portion is configured to rotate the DUT around a first axis. The apparatus may further include an arm portion configured to rotate the DUT around a second axis perpendicular to the first axis. The apparatus may further include a platform portion configured to couple to the DUT. Other embodiments may be described and claimed.