Multi-Beam Interference Pattern Generation via Diffraction Grating

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Solution Overview

Problem

Current technologies lack methods for generating non-trivial, custom illumination patterns with periodicity larger than two times the spot size in two-dimensional systems, particularly for applications like fluorescence microscopy, where achieving high contrast and sub-pixel resolution is essential without bulky optical components.

Innovation Solution

A method involving multi-beam interference of electromagnetic radiation, where grid points in a complex plane are computed to achieve desired symmetry and sideband suppression, allowing for the generation of periodic or quasi-periodic interference patterns with high contrast and tunable illumination spots, enabling dynamic manipulation of the interference pattern's position, periodicity, and orientation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If multi-beam interference is used to generate structured radiation patterns, then flexibility to produce high-resolution periodic patterning is improved, but device complexity increases due to need for intricate beam orientation and interference control

Engineering Contradiction:
Improvepattern resolutionVSAvoidbeam interference system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent uses a diffraction grating to create a copied interference pattern on the sensor array. The grating equation (d sinθ = mλ) allows replication of the input beam interference pattern at a scaled position, eliminating the need for direct multi-beam interference setup while achieving the same high-resolution patterning effect

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent replaces the mechanical/optical complexity of direct multi-beam interference with a simpler diffraction-based system. Instead of manually orienting multiple beams to create interference patterns, the system uses a diffraction grating to automatically generate the desired pattern through wave diffraction and interference at the sensor plane

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If conventional lens-based optical microscopes are used for fluorescence microscopy, then imaging resolution is improved, but device size increases due to bulky optical components

Engineering Contradiction:
Improveimaging resolutionVSAvoidmicroscope size
Core Design Contradiction:
Measurement precisionVSVolume of moving object

Solution Approach 1:

The patent extracts the resolution-enhancing function from the bulky lens system and implements it directly at the sensor array level. By placing the diffraction grating and structured illumination pattern generation at the sensor plane, the system eliminates the need for large objective lenses while achieving sub-pixel resolution through patterned illumination and computational processing

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent moves the resolution enhancement mechanism from the optical path (lens-based) to the sensor plane (diffraction grating-based). This dimensional shift allows resolution improvement without increasing the physical size of the optical components, as the pattern generation occurs at the detection plane rather than requiring large optical elements

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Manufacturing precision

If arbitrary (quasi-) periodic radiation interference patterns are generated using MBI, then capability to fabricate precise microstructures is improved, but difficulty of controlling beam parameters and their relation to resulting patterns increases

Engineering Contradiction:
Improvemicrostructure precisionVSAvoidbeam parameter control difficulty
Core Design Contradiction:
Manufacturing precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent uses the diffraction grating equation (d sinθ = mλ) as a feedback relationship between beam parameters and resulting patterns. The grating provides a deterministic mapping between input beam angles and output pattern positions, making it easier to control and predict the resulting interference pattern based on simple grating parameters rather than complex multi-beam geometry

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent simplifies parameter control by changing from direct multi-beam angle control to grating parameter control. By adjusting the diffraction grating spacing (d) and order (m), the system achieves precise control over the interference pattern periodicity and position through a single parameter (grating spacing) rather than multiple beam angles

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the creation of high-contrast, high signal-to-background imaging and lithography patterns, suitable for applications like microscopy and 3D printing, with the ability to control and modify the interference pattern's characteristics, achieving sub-pixel resolution without the need for bulky optical components.

Implementation Method 1

the plurality of light beams intersect and interfere at the image plane to produce illumination pattern

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS11555745B2Method and device for generating (quasi-) periodic interference patterns
Publication Date: 2023.01.17 INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)
  • US11555745B2 patent drawing
  • US11555745B2 patent drawing
  • US11555745B2 patent drawing

AI summary

Example embodiments relate to methods and devices for generating (quasi-) periodic interference patterns. One embodiment includes a method for generating an interference pattern using multi-beam interference of electromagnetic radiation. The method includes computing a set of grid points in a complex plane representing a grid with a desired symmetry. The method also includes selecting a radius of a virtual circle. Additionally, the method includes selecting a set of grid points in the complex plane that lies on the virtual circle centered around a virtual center point. Further, the method includes associating an argument of each grid point of the selected set of grid points in the complex plane with a propagation direction of plane waves or quasi plane waves or parallel wave fronts. In addition, the method includes obtaining the interference pattern that is a superposition of the plane waves or quasi plane waves or parallel wave fronts.