Multi-Cathode PVD Chamber for High-Aspect-Ratio Seed Coverage

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Solution Overview

Problem

Physical vapor deposition (PVD) processes face challenges in achieving uniform film deposition and step coverage for high aspect ratio features due to the line-of-sight nature of the process, leading to poor coverage and uniformity in features like high aspect ratio vias.

Innovation Solution

A PVD chamber design with multiple targets and a rotating pedestal allows for simultaneous control of voltage biases for each target, enabling different sputtering profiles and ion energy distributions to improve uniformity and step coverage by adjusting the throw distance, deposition angle, and magnetic confinement, thereby providing a broader or narrower profile as needed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a single source PVD sputtering is used, then hardware cost is reduced, but film deposition uniformity and step coverage for high aspect ratio features deteriorates

Engineering Contradiction:
Improvehardware costVSAvoidfilm deposition uniformity
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The single sputtering source is divided into multiple independent targets (first target and second target) positioned at different distances from the workpiece. Each target can be independently controlled with separate voltage biases, allowing different sputtering profiles to be generated simultaneously. This segmentation enables the first target to provide broader coverage while the second target provides narrower, more focused deposition, resolving the uniformity issue without requiring a completely complex multi-source system.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the processing chamber are assigned different sputtering characteristics through the multiple targets. The first target (closer to workpiece) provides a first ion energy distribution and deposition profile, while the second target (farther from workpiece) provides a second ion energy distribution and deposition profile. This local differentiation of deposition quality allows optimization for both step coverage and overall uniformity simultaneously.

Inventive Principle:
Principle #3Local quality

2Device complexity

If a single source PVD sputtering is used, then device complexity is reduced, but step coverage and sidewall coverage for high aspect ratio vias deteriorates

Engineering Contradiction:
Improvesystem complexityVSAvoidstep coverage
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The sputtering system is segmented into multiple targets with independent control, allowing each target to be optimized for specific deposition angles and profiles. The first target can be optimized for sidewall coverage while the second target optimizes for bottom coverage, achieving comprehensive step coverage without requiring overly complex mechanical systems.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system changes multiple parameters simultaneously including throw distance, deposition angle, and ion energy distribution by using multiple targets at different positions. Each target operates with independently controllable voltage bias, allowing dynamic adjustment of sputtering parameters to achieve optimal step coverage for high aspect ratio features.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If PVD sputtering is performed for longer time to improve coverage, then step coverage improves, but productivity decreases

Engineering Contradiction:
Improvestep coverageVSAvoiddeposition throughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

Multiple targets operate simultaneously to deposit material onto the workpiece, providing continuous and enhanced material flux. This parallel deposition action from multiple sources increases the overall deposition rate while maintaining improved step coverage, eliminating the need for extended processing times.

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The system optimizes deposition parameters including ion energy distribution and throw distance to enhance deposition efficiency. By controlling the voltage bias and position of multiple targets, the system achieves both improved step coverage and maintained productivity through parameter optimization rather than extended processing time.

Inventive Principle:
Principle #35Parameter changes

4Manufacturing precision

If multiple targets with different distances from workpiece are used, then film deposition uniformity improves, but device complexity increases

Engineering Contradiction:
Improvefilm deposition uniformityVSAvoidtarget configuration complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The system is segmented into a minimal necessary number of targets (first and second targets) positioned at different distances, providing the required deposition profiles without excessive complexity. Each target serves a specific function in the deposition pattern, achieving uniformity with a manageable configuration.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple targets serve multiple functions simultaneously: they provide different throw distances, different deposition angles, and different ion energy distributions. This multi-functionality allows a single target configuration to achieve what would otherwise require multiple separate processing steps or more complex mechanical systems.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances film deposition uniformity and coverage across high aspect ratio features, allowing for more flexible process parameters to balance coverage, throughput, and layer characteristics, improving the reliability of electroplating processes.

Implementation Method 1

The magnet array forms a magnetic field that traps electrons and thus confines a significant portion of the plasma close to the target

Methodology Applied
Scientific EffectMagnetic field: Magnetic Field

Implementation Method 2

The high voltage generates an electric field inside the PVD chamber that is used to enable sputtering of the target material and generate and emit electrons from the target

Methodology Applied
Scientific EffectElectric field: Electric Field

Implementation Method 3

The collision between the trapped electron(s) and gas atoms will cause the gas atoms to emit electrons that are used to sustain and further increase the plasma density within the processing region

Methodology Applied
Scientific EffectIonization: Ionisation

Implementation Method 4

The argon ions are accelerated towards the target due to the negative bias and collide with a surface of the target causing atoms of the target material to be ejected therefrom

Methodology Applied
Scientific EffectSputtering: Sputtering

Implementation Method 5

The ejected atoms of target material then travel towards the workpiece and chamber shielding to incorporate into the growing thin film thereon

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS12195843B2Multicathode PVD system for high aspect ratio barrier seed deposition
Publication Date: 2025.01.14 APPLIED MATERIALS INC
  • US12195843B2 patent drawing
  • US12195843B2 patent drawing
  • US12195843B2 patent drawing

AI summary

Apparatus and methods for multi-cathode barrier seed deposition for high aspect ratio features in a physical vapor deposition (PVD) process are provided herein. In some embodiments, a PVD chamber includes a pedestal disposed within a processing region of the PVD chamber. The pedestal rotates with a workpiece on it. The PVD chamber includes a lid assembly includes a first target and a second target of a same target material, where a first surface of the first target defines a first zone of the processing region a first distance from the upper surface of the pedestal, and a second surface of the second target defines a second zone of the processing region a second distance from the plane of the upper surface of the pedestal. A system controller is configured to simultaneously control a first voltage bias for the first target and a second voltage bias for the second target.