Multi-Channel Noise Measurement Apparatus for DUT
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for measuring noise contributions of a device under test (DUT) in a circuit are limited by time-consuming calibration processes and may not accurately represent noise performance with operational signals, as they introduce noise and are restricted to measurement equipment signals.
Innovation Solution
A multi-channel measurement apparatus and method using coherent measurement channels to generate and measure signals, allowing for the calculation of signal-to-noise ratio (SNR) independent of measurement channel noise spectrums, and correcting for correlated noise sources, eliminating the need for separate calibration measurements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If calibration processes are used to separate measurement apparatus noise from DUT noise, then measurement accuracy is improved, but measurement time increases significantly
Solution Approach 1:
The patent extracts the measurement apparatus noise contribution from the total measured noise by using multiple independent measurement channels. By measuring the same DUT output through multiple channels with different noise characteristics and processing the results (e.g., through subtraction or statistical analysis), the apparatus noise is separated from the DUT noise without requiring traditional calibration procedures.
Solution Approach 2:
The measurement system performs self-characterization by using its own multiple measurement channels to automatically determine and subtract its noise contributions. The system measures the DUT through multiple channels, processes these measurements to identify apparatus noise, and generates corrected DUT noise measurements without external calibration equipment or procedures.
2Measurement precision
If traditional measurement apparatus is used, then calibration can be performed, but the measurements are limited to equipment signals and do not represent actual circuit noise performance
Solution Approach 1:
The measurement apparatus is designed with multiple measurement channels that can process different types of signals (test signals and operational signals) through the same DUT. This multi-functional capability allows the system to measure noise performance under various operating conditions, making the measurement results more representative of actual circuit behavior regardless of signal type.
Solution Approach 2:
The system changes measurement parameters by using multiple measurement channels with different characteristics to measure the same DUT output. By varying the measurement path and processing the results, the system can accurately determine DUT noise performance for different signal types including operational signals that would not be available in traditional calibrated measurement setups.
3Measurement precision
If multiple measurement channels are used to eliminate calibration, then measurement accuracy is improved, but device complexity increases
Solution Approach 1:
The measurement system is segmented into multiple independent measurement channels, each with its own noise characteristics. By dividing the measurement function across multiple channels and processing their outputs separately and then combining results, the system eliminates the need for calibration while maintaining accuracy. The segmentation allows parallel measurement paths that independently characterize the DUT.
Solution Approach 2:
The multiple measurement channels act as intermediaries between the DUT and the analysis system. Each channel provides an independent measurement path that mediates the noise measurement process, allowing the system to separate apparatus noise from DUT noise through mathematical processing of the multiple intermediate measurements without requiring direct calibration.
Data Source
AI summary
An apparatus and method for measuring the properties of a DUT characterized by a signal gain applied to an input signal to that DUT and a DUT noise spectrum introduced by that DUT is disclosed. An apparatus includes first and second measurement channels and a controller. The first and second measurement channels are characterized by gains and noise spectrums that are different for the different channels and generate first and second measurement signals. The controller measures an average value of a product of the first and second measurement signals when an input signal is applied to the input of the DUT, the controller providing a measure of the signal to noise ratio of the output of the DUT, independent of the noise spectrums in the first and second measurement channels. Four channel embodiments reduce the amount of calibration needed to measure the gain and noise spectrum of the DUT.


