Multi-Circuit Intermittent Fault Detection Using Simultaneous Stimulus
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Solution Overview
Problem
Existing technologies are ineffective in detecting and isolating intermittent faults in complex electronic systems used in mission-critical machines, as they rely on serial testing methods that fail to capture randomly occurring, low-level faults across multiple circuits.
Innovation Solution
A testing apparatus that simultaneously applies a stimulus signal to all connection points in a unit under test, using active intermittence detecting circuits and a logic circuit to identify and timestamp faults, while mapping interconnections between connection points through a database system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If serial test methods are used to measure ohmic continuity one circuit at a time, then the testing apparatus can provide stable readings, but the likelihood of detecting randomly occurring intermittent faults becomes infinitesimally small
Solution Approach 1:
The system divides the testing function into two distinct modes: a first testing mode that provides stable readings by averaging measurements over time, and a second testing mode that rapidly scans circuits to detect intermittent faults. This segmentation allows each mode to optimize for its specific purpose without compromise.
Solution Approach 2:
The system dynamically switches between the first testing mode (stable readings) and the second testing mode (intermittent fault detection) based on operational requirements. The controller can transition between these modes to adapt to different testing scenarios, enabling both stability and fault detection capabilities.
2Measurement precision
If traditional continuity test technologies are used, then the testing apparatus can provide stable readings, but it can only test one line or circuit at a time
Solution Approach 1:
The system segments testing operations into two distinct modes: a first mode that tests one circuit at a time with high stability, and a second mode that rapidly scans multiple circuits in parallel to detect intermittent faults. This allows the system to maintain measurement precision while dramatically improving testing productivity.
Solution Approach 2:
The system employs periodic action by alternating between the first testing mode (detailed stable measurement) and the second testing mode (rapid periodic scanning). This periodic switching enables the system to achieve both stable readings and high-speed testing of multiple circuits.
3Reliability
If oscilloscopes are used to detect intermittence, then they can detect intermittent faults, but they can only trigger on a single line or circuit at a time
Solution Approach 1:
The system segments the fault detection function into a first testing mode that provides stable baseline readings and a second testing mode that performs rapid intermittent fault detection across multiple circuits simultaneously. This segmentation enables multi-circuit testing capability that oscilloscopes lack.
Solution Approach 2:
The system replaces the oscilloscope's single-line trigger mechanism with an electronic scanning system that can monitor multiple circuits simultaneously. This substitution enables parallel testing of multiple circuits while maintaining intermittent fault detection capability.
4Reliability
If oscilloscopes are used for testing, then they can detect intermittence, but they require an electrical stimulus on the line making them impractical for testing hundreds or thousands of circuits
Solution Approach 1:
The system segments testing into two modes: a first mode that establishes stable baseline readings with electrical stimulus, and a second mode that performs rapid stimulus-free scanning of hundreds or thousands of circuits. This eliminates the need for complex stimulus generation for each circuit while maintaining detection capability.
Solution Approach 2:
The system performs preliminary action by establishing stable baseline readings in the first testing mode before conducting rapid intermittent fault detection in the second mode. This preliminary stabilization enables subsequent fast scanning without requiring electrical stimulus during the scanning phase.
Data Source
AI summary
Embodiments are directed to identifying intermittent faults in a unit under test (UUT), and to mapping interconnections between connection points in a UUT. In one scenario, a testing apparatus includes an interface for electrically attaching the UUT to a testing module and an input circuit for supplying an individual stimulus signal to each unpowered connection point in the UUT. The testing apparatus also includes an active intermittence detecting circuit electronically connected to each connecting point in the UUT. A stimulus signal is applied simultaneously to each connecting line, so that an intermittent fault on any line will generate a trigger on those connection lines that have an intermittent fault. The testing apparatus also includes a logic circuit that determines when a trigger has been generated on the UUT, determines the connection point of the trigger, assigns a timestamp to the intermittent fault, and generates reporting data for the intermittent fault.