Multi-Contact Probe Structure for Stable Electrical Testing
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Solution Overview
Problem
The resistance value of contact probes with relatively small loads increases with the number of electrical tests, leading to inaccurate electrical test results and reduced reliability in IC package testing.
Innovation Solution
A contact probe design featuring a tubular structure with an elastic member and engagement part, providing multiple contact points and a stable support through engagement and pushing parts to maintain consistent contact surfaces, ensuring stability and reliability during electrical testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the contact probe is used for repeated electrical tests, then the number of tests increases, but the resistance value increases and exceeds the allowable resistance value
Solution Approach 1:
The elastic member is designed to be dynamically adjustable within the tubular structure, allowing it to adapt its position and contact pressure based on usage conditions. This dynamic capability enables the contact probe to maintain stable electrical contact over repeated tests while automatically compensating for wear and resistance changes, thereby resolving the contradiction between increased test numbers and resistance stability
Solution Approach 2:
The elastic member's physical parameters (elasticity, contact pressure) are designed to change in response to operational conditions. As the contact probe undergoes repeated testing, the elastic member's parameters naturally adjust to compensate for wear, maintaining optimal contact pressure and resistance levels throughout the probe's service life, thus preventing resistance from exceeding allowable values
2Stability of the object's composition
If the elastic member is engaged with the engagement part, then the contact probe structure becomes stable, but the resistance value increases with repeated use
Solution Approach 1:
The elastic member is designed to self-adjust and self-compensate within the stable structure. Through its elastic properties, it automatically maintains optimal contact pressure and alignment with the tubular structure's contact surfaces during repeated tests, preventing resistance increase without requiring external adjustment mechanisms, thus maintaining both structural stability and resistance consistency
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The design enhances the stability and reliability of electrical testing by maintaining consistent contact surfaces, reducing resistance variation and improving the accuracy of test results.
Implementation Method 1
The elastic member abuts closely against an inner wall of the tubular structure, and a part of the tubular structure abutting against the elastic member has at least two contact surfaces
Data Source
AI summary
A contact probe that includes a tubular structure, an engagement part and an elastic member. The elastic member is received within the tubular structure; the engagement part is arranged within the tubular structure; a part of the elastic member is arranged in the tubular structure, a first end of the elastic member is engaged with the engagement part, the elastic member abuts closely against an inner wall of the tubular structure, and a part of the tubular structure abutting against the elastic member has at least two contact surfaces. During installation, the first end of the elastic member is engaged with the engagement part of the tubular structure. At this time, the elastic member abuts closely against the inner wall of the tubular structure, and the part of the elastic member abutting against the tubular structure has at least two contact surfaces. Since there are stable contact surfaces between the elastic member and the tubular structure, the elastic member can always contact with at least two contact surfaces of the tubular structure when the elastic member is bent, thereby improving the stability of the structures within the contact probe and improving the stability of electrical testing.