Multi-DUT Test Circuit with Standby Pre-Charging
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Solution Overview
Problem
Existing test apparatuses face challenges in efficiently testing multiple devices under test (DUTs) by ensuring each DUT is in a stable standby state for accurate measurements, particularly when capacitive loads are involved, leading to potential interference and delayed testing.
Innovation Solution
The test apparatus incorporates a second voltage source to pre-charge non-target DUTs to a standby potential, using a separate current path and voltage that is insulated from the primary measurement path, allowing simultaneous measurement and earlier initiation of testing on target DUTs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single voltage source is used for both measurement and standby states, then device complexity is reduced, but measurement precision deteriorates due to interference and unstable standby states
Solution Approach 1:
The patent divides the voltage source function into two separate sources: a first voltage source for measurement operations and a second voltage source for standby state maintenance. This segmentation eliminates interference between measurement and standby functions, allowing each source to be optimized for its specific purpose without compromising the other.
Solution Approach 2:
The patent introduces a switching unit as an intermediary component that selectively connects either the first voltage source or the second voltage source to the device under test based on operational mode. This intermediary enables clean separation of measurement and standby functions while maintaining system integration.
2Adaptability or versatility
If capacitive loads are connected during measurement, then testing capability is improved, but harmful factors increase due to interference and coupling between wiring
Solution Approach 1:
The patent extracts the standby voltage supply function from the measurement circuit by using a separate second voltage source that is only connected to non-target devices during measurement operations. This extraction eliminates capacitive coupling and interference between the measurement path and standby paths, allowing capacitive loads to be tested without introducing harmful coupling effects.
3Measurement precision
If sequential testing of multiple DUTs is performed, then measurement accuracy is maintained, but productivity decreases due to delayed testing initiation
Solution Approach 1:
The patent implements preliminary action by using the second voltage source to place non-target devices in a stable standby state before measurement operations begin. This pre-conditioning of devices allows the measurement system to immediately start testing without waiting for devices to be powered up or stabilized, thereby reducing overall testing time while maintaining accuracy through proper standby state management.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach ensures that non-target DUTs are placed in a stable standby state, reducing interference and enabling faster, more accurate testing of each DUT by minimizing impedance and inter-wiring coupling, thus enhancing testing efficiency.
Implementation Method 1
a second voltage source 23 that outputs a second voltage to connection terminals 101 of another at least one DUT 10 which is different from the DUT 10 serving as a test target, among the plurality of DUTs 10
Data Source
AI summary
There is provided a test apparatus including a first power source which outputs a first voltage of predetermined magnitude or a first current of predetermined magnitude; a first switch unit which connects, to the first power source, a connection terminal of a device under test serving as a test target, among connection terminals of a plurality of devices under test; a first measuring unit which measures an electrical characteristic of the device under test serving as the test target in response to the first power source being connected to the device under test serving as the test target; and a second voltage source which outputs a second voltage of predetermined magnitude to a connection terminal of another at least one device under test which is different from the device under test serving as the test target, among the plurality of devices under test.