Multi-Energy X-Ray Portal Layout for Material Discrimination
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Solution Overview
Problem
Existing X-ray inspection systems face inefficiencies when a single X-ray energy range is insufficient, leading to increased complexity, cost, and inspection time due to the need for multiple systems with different energy ranges for various tasks.
Innovation Solution
A multi-energy portal system using two X-ray sources with significantly different energy ranges, combined with dual-energy technology and geometric positioning, to generate a single X-ray image with enhanced quality and improved spatial resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple separate X-ray systems with different energy ranges are used to handle various inspection tasks, then the inspection capability covers more material types and thicknesses, but the system complexity, cost, and inspection time increase
Solution Approach 1:
The patent combines multiple X-ray sources with different energy ranges (low-energy, medium-energy, and high-energy sources) into a single integrated inspection system. This merging approach allows the system to handle diverse inspection tasks including thin materials, thick materials, and intermediate materials without requiring separate systems, thereby reducing overall system complexity while maintaining versatility
Solution Approach 2:
The inspection system is designed with multi-functional capability by incorporating X-ray sources covering different energy ranges (70-450 keV, 1-9 MeV) that can collectively address various inspection requirements. The system can adaptively select appropriate energy ranges for different material types and thicknesses, providing universal inspection capability within a single system framework
2Adaptability or versatility
If multiple separate X-ray systems with different energy ranges are used to handle various inspection tasks, then the inspection capability covers more material types and thicknesses, but the inspection time increases
Solution Approach 1:
By merging multiple energy range capabilities into a single system, the patent enables simultaneous or rapid sequential inspection of different material types without requiring physical relocation or switching between separate systems, thereby reducing inspection time while maintaining comprehensive material coverage
Solution Approach 2:
The system dynamically selects and switches between different energy ranges (low-energy for thin materials, high-energy for thick materials) based on real-time inspection requirements, allowing adaptive response to varying material conditions without manual intervention or system reconfiguration, thus optimizing inspection speed and efficiency
3Length of stationary object
If a single high-energy X-ray source is used, then the penetration capability for thick objects is improved, but the spatial resolution and material discrimination capability deteriorate
Solution Approach 1:
The patent segments the X-ray energy spectrum into multiple ranges with dedicated sources: low-energy sources (70-450 keV) for high-resolution imaging of thin materials, and high-energy sources (1-9 MeV) for penetrating thick materials. This segmentation allows each energy range to be optimized for its specific function, maintaining high spatial resolution where needed while achieving deep penetration where required
Solution Approach 2:
Different energy ranges are applied locally according to the inspection needs: low-energy X-rays are used for regions requiring high spatial resolution and material discrimination, while high-energy X-rays are used for regions requiring deep penetration. This local quality approach ensures optimal performance for each specific inspection scenario within the same system
4Manufacturing precision
If a single low-energy X-ray source is used, then the spatial resolution and material discrimination capability are improved, but the penetration capability for thick objects deteriorates
Solution Approach 1:
The system segments inspection tasks by thickness and material density, assigning low-energy sources (70-450 keV) to thin material inspection where high spatial resolution is critical, and high-energy sources (1-9 MeV) to thick material inspection where penetration is critical, with intermediate sources handling transitional cases
Solution Approach 2:
The system changes the energy parameter of X-ray sources based on inspection requirements, switching between low-energy and high-energy ranges to optimize the balance between spatial resolution and penetration depth for different material conditions
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system provides a cost-effective solution by combining high and low-energy sources to achieve accurate material discrimination and high spatial resolution, reducing inspection time and complexity while minimizing radiation exposure.
Implementation Method 1
a first X-ray source emitting a first fan shaped X-ray beam; a second X-ray source emitting a second fan shaped X-ray beam
Implementation Method 2
a first detector and a second detector that detect X-rays passing through the object from the first and second X-Ray sources, respectively
Data Source
AI summary
System for scanning an object, including first X-ray source emitting a first fan shaped beam; second X-ray source emitting second fan shaped beam; the first and second beams are parallel; first detector and second detector that detect X-rays passing through the object from the sources; wherein the first X-ray source and the second X-ray source focal spots are at a same height; the object moves laterally past the first beam and the second beam and parallel to a line connecting focal spots of first source and second source; first source has photon energy of E1 MeV and E2 MeV, such that beams are emitted in short pulses alternating between E1 and E2, wherein E1 and E2 are between 450 KeV and 9 MeV; and second source has photon energy of 70 KeV to 450 KeV; workstation combines atomic numbers and signal intensities generated by X-rays.