Multi-Focus X-Ray Source Uniform Signal Distribution
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Solution Overview
Problem
Conventional multi-detector inverse fan beam x-ray diffraction imaging systems experience non-uniform signal distribution due to comparable spatial extents of the multi-focus x-ray source and coherent x-ray scatter detector array, leading to inefficient detection and higher false alarm rates.
Innovation Solution
A multi-detector inverse fan beam x-ray diffraction imaging system with a compact multi-focus x-ray source and strategically positioned coherent x-ray scatter detectors, where each focus point emits pencil primary x-ray beams and detectors are arranged to satisfy a specific spacing equation, ensuring uniform signal coverage and redundancy across the object.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the multi-focus x-ray source and detector array have comparable spatial extents, then the system can cover the entire object width, but the scatter signal distribution becomes significantly non-uniform
Solution Approach 1:
The patent applies local quality by making the MFXS smaller than the object width, creating a localized beam configuration where each detector receives a narrow pencil beam. This localized approach ensures uniform signal distribution across different regions of the object, with each point being seen by at least M detectors, rather than having uniform source coverage that creates non-uniform signal distribution.
2Manufacturing precision
If the MFXS is smaller than the object width to achieve uniform coverage, then signal uniformity improves, but the inverse fan beam bundle becomes narrow approximating a pencil beam
Solution Approach 1:
The patent applies segmentation by dividing the detection task across multiple detectors, where each detector captures scatter from a specific pencil beam. The system segments the object into multiple regions, each monitored by specific detector-source pairs, with redundancy (M detectors per point) ensuring comprehensive coverage while maintaining uniformity.
Solution Approach 2:
The patent transitions from a conventional fan beam geometry to an inverse fan beam geometry, effectively changing the dimensional arrangement of the beam paths. This dimensional change allows the narrow pencil beams to sweep across the object while multiple detectors positioned at different locations capture scattered photons, maintaining both uniformity and detection efficiency.
3Manufacturing precision
If the inverse fan beam bundle is narrow (pencil beam), then uniform signal distribution is achieved, but photon efficiency and detection accuracy decrease
Solution Approach 1:
The patent applies preliminary action by pre-positioning multiple detectors to intercept scattered photons from each pencil beam path before the photons are lost. The system is configured in advance with detectors at specific locations and angles, ensuring that scattered photons are captured efficiently. This preliminary arrangement of detectors compensates for the narrow beam geometry, maintaining detection accuracy while preserving signal uniformity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves higher photon efficiency, reduced false alarm rates, and increased detection accuracy with a more uniform intensity distribution, facilitating cost-effective and reliable security screening.
Implementation Method 1
an x-ray source transmits x-rays through an object or a container
Implementation Method 2
x-ray diffraction imaging systems use an inverse fan-beam geometry and a multi-focus x-ray source to measure d-spacings between lattice planes of micro-crystals in materials
Implementation Method 3
detect coherent scatter rays from a plurality of primary beams as the plurality of primary beams propagate through an object
Data Source
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AI summary
A multi-focus x-ray source (MFXS) for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MFXS (12) includes a plurality of focus points (54) defined along a length of the MFXS collinear with the y-axis (58). The MFXS (12) is configured to generate the plurality of primary beams (60), and at least M coherent x-ray scatter detectors (24) are configured to detect coherent scatter rays from the primary beams as the primary beams propagate through a section of the object positioned within the examination area (14) when a spacing P between adjacent coherent x-ray scatter detectors satisfies the equation: P=Ws⋅VM⋅U, where Ws is a lateral extent of the plurality of focus points (54), U is a distance from the y-axis (58) to a top surface of the examination area, and V is a distance from the top surface to the line at the coordinate X = L.