Multi-Frequency Component Testing for Faster Frequency Response Measurement
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Solution Overview
Problem
Existing methods for testing electronic components at multiple frequencies are time-consuming and inefficient, as they require sequential application of test signals at different frequencies to characterize the frequency response of a component.
Innovation Solution
A method and apparatus that generate a digital representation of a signal with multiple sine waves of unique frequencies, converted into an analog signal and applied simultaneously to a device under test, using dual analog-to-digital converters to measure voltage and current responses, allowing for the determination of frequency response over a range of frequencies with a single application.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If sequential testing at different frequencies is performed, then measurement precision of frequency response is improved, but loss of time increases
Solution Approach 1:
The patent combines multiple frequency tests into a single simultaneous measurement by injecting a composite signal containing multiple frequency components through the device under test. The system merges the testing of multiple frequencies into one operation, capturing voltage and current responses at all frequencies concurrently rather than sequentially, thereby reducing total testing time while maintaining measurement precision through spectral analysis of the combined response signals.
Solution Approach 2:
The patent employs periodic sinusoidal signals at multiple frequencies simultaneously as the test input. By using periodic actions at different frequencies that can be mathematically separated through Fourier analysis, the system achieves frequency response characterization across multiple frequencies in parallel, resolving the time-consuming nature of sequential periodic testing while preserving the precision benefits of periodic signal analysis.
2Productivity
If multiple frequencies are applied simultaneously, then productivity is improved, but device complexity increases
Solution Approach 1:
The patent introduces a digital signal processor as an intermediary that generates the multi-frequency composite signal and processes the captured voltage and current responses. This intermediary component handles the mathematical complexity of spectral analysis and frequency separation, allowing the core measurement system to remain relatively simple while achieving high productivity through simultaneous multi-frequency testing.
Solution Approach 2:
The patent replaces complex physical switching mechanisms that would be needed to sequentially apply different frequencies with a digital signal processing approach. Instead of mechanically or electrically switching between different test signals, the system uses digital generation of composite signals and mathematical separation techniques, substituting computational complexity for physical complexity and thereby improving productivity without excessive hardware complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces testing time by applying multiple frequencies simultaneously, enabling quick characterization of a component's frequency response and allowing for the simultaneous testing of multiple components.
Implementation Method 1
The digital representation may be converted into an analog signal, and applied to a device under test (DUT)
Implementation Method 2
A first analog-to-digital converter (ADC) may be coupled to measure voltages across the DUT, while a second ADC may be coupled to measure currents through the DUT. Voltage and current signals received by the first and second ADCs, respectively, may be converted into first and second digital values
Data Source
AI summary
A method and apparatus for simultaneously testing a component at multiple frequencies is disclosed. A digital processing circuit may generate a digital representation of a signal having a plurality of sine waves, each having a unique frequency. The digital representation may be converted into an analog signal, and applied to a device under test (DUT). A first analog-to-digital converter (ADC) may be coupled to measure voltages across the DUT, while a second ADC may be coupled to measure currents through the DUT. Voltage and current signals received by the first and second ADCs, respectively, may be converted into first and second digital values. Voltage and current values at each unique frequency are determined from the first and second digital values. Using the voltage and current values for each unique frequency, a frequency response of the component (e.g., an impedance) over a range of frequencies may be determined.