Multi-function Illuminator for Machine Vision Defect Detection
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Solution Overview
Problem
Machine vision systems face challenges in acquiring high-quality images due to suboptimal lighting configurations, which affect feature contrast and reliability, particularly in applications where the size, surface features, and geometry of the object being inspected vary widely.
Innovation Solution
The implementation of a machine vision system that incorporates a patterned area light source and a digital camera oriented at specific angles to capture reflections, along with a digital image data receiving module and a phase measuring deflectometry module, allowing for the determination of defects based on digital image data. Additionally, the system includes a multi-function illuminator with various light sources such as dome light, dark-field light, direct light, and off-axis light, and a light emitting diode driver circuit with on-times of less than 10 nanoseconds.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple light sources with different configurations are used to handle diverse inspection scenarios, then adaptability is improved, but device complexity increases
Solution Approach 1:
The patent implements a multi-function illuminator that integrates multiple light sources (dome light, dark-field light, direct light, off-axis light) into a single device. Each light source can be independently controlled to address different inspection scenarios, allowing one device to perform multiple functions rather than requiring separate illumination sources for each inspection type
Solution Approach 2:
The system dynamically selects and activates specific light sources based on the inspection requirements. The controller can independently control each light source, enabling adaptive adjustment of illumination characteristics to match the specific inspection scenario, thereby managing complexity through intelligent control rather than fixed configuration
2Measurement precision
If light sources are oriented to capture reflections for defect detection, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The camera is pre-positioned to capture reflections of light from the illuminated surface. This preliminary geometric arrangement ensures that when light strikes the surface, the reflection naturally directs toward the camera, enabling defect detection through phase measuring deflectometry without requiring additional optical components or complex alignment mechanisms during operation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances image quality by maximizing feature contrast while minimizing background contrast, enabling accurate defect detection and improving system reliability across diverse inspection scenarios.
Implementation Method 1
The field of view of the at least one digital camera may encompass reflection of at least a portion of light emitted by the at least one patterned area light source from the surface of the object to be inspected
Implementation Method 2
a phase measuring deflectometry module stored on the memory of a computing device that, when executed by a processor of the computing device, may cause the processor to determine whether the surface of the object to be inspected includes a defect based on the digital image data
Data Source
AI summary
The present disclosure generally relates to machine vision systems, illumination sources for use in machine vision systems, and components for use in the illumination sources. More specifically, the present disclosure relates to machine vision systems incorporating multi-function illumination sources, multi-function illumination sources, and components for use in multi-function illumination sources.