Multi-Head Cartridge Testing Through Package Openings
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Solution Overview
Problem
Conventional cartridge test devices can only test a single cartridge at a time, leading to low testing efficiency and high costs due to the need for individual connections with spring needles.
Innovation Solution
A cartridge test device with multiple test heads that can simultaneously connect with multiple cartridges through openings in a cartridge package, allowing for simultaneous testing without disassembly, and a data transmission apparatus for efficient data exchange with the chips.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a conventional cartridge test device uses a spring needle to contact and connect with chips on cartridges, then the chip testing function is achieved, but only a single cartridge can be tested at a time, resulting in low testing efficiency and high testing cost
Solution Approach 1:
The test device is segmented into multiple independent test heads (first test head, second test head, etc.), each capable of independently testing a cartridge. The cartridge package is also segmented with multiple openings corresponding to each test head. This segmentation allows parallel testing of multiple cartridges simultaneously, dramatically improving productivity while maintaining relatively simple individual test head structures.
Solution Approach 2:
Each test head is designed with universal functionality to test different cartridges through standardized openings in the cartridge package. The test heads can be configured to accommodate different cartridge types, and the cartridge package structure is designed to universally accommodate multiple cartridges in a standardized arrangement, enabling the system to handle various testing scenarios with the same basic structure.
2Productivity
If multiple cartridges are tested simultaneously, then testing efficiency is improved, but the device structure becomes more complex
Solution Approach 1:
The test device is segmented into multiple independent test heads (first test head, second test head, etc.), each capable of independently testing a cartridge. The cartridge package is also segmented with multiple openings corresponding to each test head. This segmentation allows parallel testing of multiple cartridges simultaneously, dramatically improving productivity while maintaining relatively simple individual test head structures.
Solution Approach 2:
Multiple test heads are combined within a single device housing, sharing common control systems, power supplies, and data processing units. The cartridge package is designed as a unified structure holding multiple cartridges, with openings aligned to correspond with each test head. This merging approach enables simultaneous testing while avoiding the need for completely separate testing devices, thus limiting the increase in overall device complexity.
3Reliability
If individual connection with spring needle is used for each cartridge, then reliable electrical connection is achieved, but the testing cost increases and efficiency decreases
Solution Approach 1:
The test device is segmented into multiple independent test heads (first test head, second test head, etc.), each capable of independently testing a cartridge. The cartridge package is also segmented with multiple openings corresponding to each test head. This segmentation allows parallel testing of multiple cartridges simultaneously, dramatically improving productivity while maintaining relatively simple individual test head structures.
Solution Approach 2:
The cartridge package structure itself provides the connection interface through its openings, which are designed to align with the test heads. The cartridges are arranged in the package in a way that their connection points are automatically positioned to contact with the corresponding test heads, reducing the need for additional complex connection mechanisms and enabling efficient parallel testing.
Data Source
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AI summary
The present invention provides a cartridge test device, a cartridge component, and a cartridge component test method. The cartridge test device includes a device main body (21), a data transmission apparatus (22) mounted on the device main body (21), and a plurality of test heads (23). The test heads (23) are connected to the device main body (21) and are in either or both of electrical connection and signal connection with the data transmission apparatus (22). Each of the test heads (23) can test a cartridge. The device and the method can improve test efficiency of the cartridge and reduce test costs.