Multi-Modal Measurement System for Board Inspection Alignment
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Solution Overview
Problem
Different imaging systems used for visible light and X-ray measurements of a board do not align accurately due to variations in board positioning, imaging angles, and deformation, making it difficult to merge data effectively for precise shape measurement.
Innovation Solution
A measurement system that includes feature point data generators for both visible light and X-ray image data, along with a calculator to determine positional correspondence between the two datasets, allowing for pixel-to-pixel alignment and merging of image data from different imaging systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple measurement principles using different imaging systems (visible light and X-ray) are used to measure the board, then measurement coverage is improved and hidden portions can be inspected, but positional alignment between image datasets deteriorates due to differences in board positioning, imaging angles, and deformation
Solution Approach 1:
The patent introduces a coordinate transformation function as an intermediary mechanism that maps coordinates from one imaging system's coordinate system to another. This transformation function acts as a mediator that reconciles the positional differences between visible light and X-ray image datasets, enabling accurate alignment without requiring the imaging systems to physically coordinate their positions and angles.
2Reliability
If data from different imaging systems are merged to achieve comprehensive inspection, then inspection quality is improved, but the complexity of data processing and alignment increases
Solution Approach 1:
The patent performs coordinate transformation and data alignment as preliminary actions before merging the datasets. By pre-processing the data to establish accurate positional correspondence between different imaging systems, the patent simplifies the subsequent merging process and reduces the complexity of handling misaligned data during inspection.
Data Source
AI summary
A measurement system includes a first feature point data generator, a second feature point data generator, and a calculator. The first feature point data generator generates first feature point data from first image data or from first shape data. The first image data is obtained from imaging of a measurement target and includes a predetermined portion of the measurement target. The first shape data is generated based on the first image data. The second feature point data generator generates second feature point data from second image data different from the first image data or from second shape data. The calculator calculates a positional correspondence of the predetermined portion of the measurement target between the first image data and the second image data or between the first shape data and the second shape data based on the first feature point data and the second feature point data.