Multi-mode Measurement Probe for Simultaneous Voltage and Current Testing
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Solution Overview
Problem
Existing test systems require multiple probes to measure voltage and current simultaneously, increasing costs and testing time, as well as necessitating the repositioning of probe connections during testing.
Innovation Solution
A multi-mode measurement probe that allows for simultaneous voltage, current, and power measurements without the need to reposition probe connections, featuring a probe tip, cables, and a compensation box with a measurement mode selector and multiplexer to route signals to a measurement instrument.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple probes are used to measure voltage and current simultaneously, then measurement capability is improved, but system cost and complexity increase
Solution Approach 1:
The probe is designed with multiple measurement modes (voltage, current, power) that can be selected through a mode selector switch, allowing a single probe to perform functions that previously required multiple separate probes. The probe tip and compensation box work together to enable versatile measurements across different parameters without requiring additional hardware.
2Adaptability or versatility
If multiple probes are used to measure voltage and current simultaneously, then measurement capability is improved, but the number of probe connections increases
Solution Approach 1:
A single probe with a mode selector switch provides multiple measurement capabilities (voltage, current, power) without requiring multiple separate probes. The probe maintains a single connection to the DUT while internally switching between measurement modes, reducing the number of physical connections needed.
3Adaptability or versatility
If probes are moved between test points to measure different parameters, then measurement flexibility is improved, but testing time increases
Solution Approach 1:
The probe incorporates a mode selector switch that dynamically changes the measurement function while maintaining the same physical connection to the DUT. This allows the probe to transition between voltage, current, and power measurement modes without being moved or repositioned, enabling flexible measurements while maintaining stable connections throughout the testing sequence.
4Device complexity
If a single probe is used for all measurements, then system cost is reduced, but measurement accuracy may deteriorate
Solution Approach 1:
The probe achieves multi-functionality through a mode selector switch that enables voltage, current, and power measurements with a single device. The compensation box and probe tip are designed to handle multiple measurement types while maintaining accuracy through proper signal conditioning and compensation circuits that adapt to different measurement modes.
Data Source
AI summary
A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.