Multi-Pin Electrical Testing with Automated Pin Multiplexing
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Solution Overview
Problem
Conventional ESD testing of multi-pin devices is time-consuming, prone to errors, and inconsistent due to the need for individual pin testing, which can lead to missed tests and inconsistent parameter settings, especially for devices like automotive controllers with hundreds of pins.
Innovation Solution
An apparatus with a connector, signal generator, multiplexer, and processor that simultaneously tests multiple pins using a sinusoidal voltage signal, automatically multiplexing pin signals, and employing digital signal processing techniques to determine electrical characteristics like reactance and equivalent series resistance, reducing errors and testing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If individual pin testing is performed manually, then measurement precision can be maintained, but testing time increases significantly and error rate increases
Solution Approach 1:
The patent combines multiple pin testing operations into a single automated test sequence. The multiplexer sequentially connects multiple pins to the LCR meter without requiring manual reconfiguration, merging what would be separate manual testing operations into one automated process. This reduces testing time while maintaining measurement precision through consistent automated parameter settings.
Solution Approach 2:
The multiplexer acts as an intermediary device that automatically switches between multiple pins and the LCR meter. This eliminates the need for manual connection and disconnection of test leads between pins, significantly reducing testing time while ensuring consistent electrical connections and measurement conditions for each pin.
2Productivity
If manual pin-by-pin testing is performed, then testing can be completed, but error rate increases due to human mistakes
Solution Approach 1:
The automated testing system performs self-service by automatically configuring test parameters, sequentially testing all pins through the multiplexer, and recording results without human intervention. This eliminates human errors such as testing the wrong pin, inconsistent parameter settings, or missing pins, thereby improving both productivity and test consistency.
Solution Approach 2:
The system incorporates automatic result recording and analysis, providing feedback on the electrical characteristics of each pin. This automated feedback mechanism ensures that all pins are tested and results are consistently captured, eliminating the human errors that occur during manual data recording and analysis.
3Loss of time
If automated multiplexing is implemented, then testing time is reduced, but device complexity increases
Solution Approach 1:
The multiplexer serves multiple functions: it sequentially connects different pins to the LCR meter, automatically switches between test signals and measurements, and manages the test sequence. This single multi-functional device replaces what would otherwise require multiple separate test instruments and manual operations, reducing overall system complexity while achieving automated high-speed testing.
4Measurement precision
If consistent test parameters are manually set for each pin, then measurement precision is maintained, but testing time increases
Solution Approach 1:
The automated testing system maintains continuous useful action by seamlessly transitioning between pins without interruption. The multiplexer continuously cycles through all pins, and the LCR meter continuously measures electrical characteristics, eliminating the start-stop nature of manual testing. This continuous operation maintains consistent measurement parameters while significantly increasing testing throughput.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus enables rapid, reliable, and repeatable testing of multi-pin devices by increasing the number of pins tested per connection, minimizing errors, and providing accurate electrical characteristic measurements, including reactance and equivalent series resistance, even after an ESD event.
Implementation Method 1
the signal generator is arranged to output a first test signal, and the processor is arranged to determine a first set of electrical characteristics from a first set of pin signals
Implementation Method 2
a multiplexer arranged to output a plurality of pin signals by selectively connecting the test signal to each of the plurality of pins through the connector
Implementation Method 3
the processor is arranged to determine reactance and equivalent series resistance of the multi-pin device from the derived current and the determined voltage drop
Data Source
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AI summary
An apparatus is provided for testing electrical characteristics of a multi-pin device. The apparatus is simultaneously connected to a plurality of pins of the device, and automatically selects measurement settings and calibrations settings. Errors and testing times are reduced significantly in comparison with conventional techniques, such as a per-pin LCR meter.