Multi-Port Circuit Board for Wafer Testing

Solution Overview

Problem

Current electrical testing devices require multiple stations to perform various tests on wafers, leading to increased costs and processing time, and data integration from multiple stations causes capacity bottlenecks in subsequent processes.

Innovation Solution

A testing device with a circuit board having multiple testing ports with different functions, moved by a movement assembly over a working platform, allowing simultaneous performance of multiple tests on objects and immediate integration of results, reducing the need for multiple stations and database retrieval.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple testing stations are set up to perform different electrical tests on wafers, then the testing functionality is improved, but the machine cost and process time are increased

Engineering Contradiction:

Improvetesting functionalityVSAvoidnumber of testing stations

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The circuit board is designed with multiple testing ports (first testing port, second testing port, etc.) that can perform different electrical tests (DC test, RF test, etc.). A single testing device with this multi-functional circuit board replaces the need for multiple separate testing stations, thereby reducing machine cost and process time while maintaining comprehensive testing functionality.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If multiple testing stations are used to perform different electrical tests, then the testing coverage is improved, but the data integration complexity and process bottleneck are increased

Engineering Contradiction:

Improvetesting coverageVSAvoiddata integration process

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent merges multiple testing functions into a single circuit board with multiple testing ports. All test results are generated within one testing device and can be integrated immediately without requiring complex data retrieval and integration operations across multiple separate stations, thereby eliminating the data integration bottleneck.

Inventive Principle:

Principle #5Merging (Combining)

3Device complexity

If a single testing station performs one electrical test, then the device simplicity is maintained, but the production capacity and plant utilization are reduced

Engineering Contradiction:

Improvetesting device structureVSAvoidproduction capacity

Core Design Contradiction:

Device complexityVSProductivity

Solution Approach 1:

The circuit board is designed with multiple testing ports (first testing port, second testing port, etc.) that can perform different electrical tests (DC test, RF test, etc.). A single testing device with this multi-functional circuit board replaces the need for multiple separate testing stations, thereby reducing machine cost and process time while maintaining comprehensive testing functionality.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Data Source

PatentUS11513152B2Testing device and method

Publication Date: 2022.11.29 SILICONWARE PRECISION IND CO LTD

AI summary

Provided is a testing method including: disposing a wafer on a working platform of a testing device; and moving a circuit board of the testing device relative to the working platform by a movement assembly of the testing device so as to allow at least two testing ports of the circuit board to test two chips of the wafer, respectively. Further, the two testing ports have different testing functions. Therefore, during the wafer testing process, a single testing device can perform multiple testing operations.